Dokyun Son
Seoul National University
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Publication
Featured researches published by Dokyun Son.
Journal of Semiconductor Technology and Science | 2016
Dokyun Son; Sangbin Jeon; Myounggon Kang; Hyungcheol Shin
In this paper, we investigated the hotcarrier injection (HCI) mechanism, one of the most important reliability issues, in 10 nm node Input/Output (I/O) bulk FinFET. The FinFET has much intensive HCI damage in Fin-bottom region, while the HCI damage for planar device has relatively uniform behavior. The local damage behavior in the FinFET is due to the geometrical characteristics. Also, the HCI is significantly affected by doping profile, which could change the worst HCI bias condition. This work suggested comprehensive understanding of HCI mechanisms and the guideline of doping profile in 10 nm node I/O bulk FinFET.
IEEE Transactions on Electron Devices | 2018
Dokyun Son; Ilho Myeong; Hyunsuk Kim; Myounggon Kang; Jongwook Jeon; Hyungcheol Shin
IEEE Transactions on Electron Devices | 2018
Hyunsuk Kim; Dokyun Son; Ilho Myeong; Myounggon Kang; Jongwook Jeon; Hyungcheol Shin
ieee silicon nanoelectronics workshop | 2017
Kyul Ko; Dokyun Son; Myounggon Kang; Hyungcheol Shin
ieee silicon nanoelectronics workshop | 2017
Ilho Myeong; Dokyun Son; Hyunsuk Kim; Myounggon Kang; Hyungcheol Shin
ieee silicon nanoelectronics workshop | 2017
Dokyun Son; Ilho Myeong; Hyunsuk Kim; Myounggon Kang; Hyungcheol Shin
ieee silicon nanoelectronics workshop | 2017
Hyunsuk Kim; Dokyun Son; Ilho Myoung; Myounggon Kang; Hyungcheol Shin
ieee silicon nanoelectronics workshop | 2017
Hyungwoo Ko; Jongsu Kim; Dokyun Son; Myounggon Kang; Hyungcheol Shin
Solid-state Electronics | 2017
Kyul Ko; Dokyun Son; Myounggon Kang; Hyungcheol Shin
Solid-state Electronics | 2017
Ilho Myeong; Dokyun Son; Hyunsuk Kim; Myounggon Kang; Hyungcheol Shin
