Eduardo Maayan
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Featured researches published by Eduardo Maayan.
international electron devices meeting | 2005
Boaz Eitan; Guy M. Cohen; Assaf Shappir; Eli Lusky; Amichai Givant; Meir Janai; Ilan Bloom; Yan Polansky; Oleg Dadashev; Avi Lavan; Ran Sahar; Eduardo Maayan
The realization of a 4-bit NROM cell is possible due to the two physically separated bits on each side of the cell. Only 4 Vt levels on each bit are required. Key features of a 4-bit product are optimized technology, accurate and fast programming algorithm (3MB/s write speed), no single bit failures and window sensing with moving reference as an error detection and correction scheme
international memory workshop | 2013
Saied Tehrani; James Pak; Mark Randolph; Yu Sun; Sameer Haddad; Eduardo Maayan; Yoram Betser
Charge-trap Flash memory has been successfully productized in high volume for several technology generations. Two-bits-per-cell MirrorBit® charge-trap technology has been the industry benchmark for NOR Flash for more than a decade, spanning six generations of scaling. More recently Heterogeneous Charge Trap (HCT)™ NAND Flash as well as embedded Charge Trap (eCT)™ NOR Flash have been developed. The planar cell structures will enable continued scaling of these charge-trap technologies, while new architectures such as 3D charge-trap Flash will emerge and further extend the density-growth trend.
international solid-state circuits conference | 2006
Yan Polansky; Avi Lavan; Ran Sahar; Oleg Dadashev; Yoram Betser; Guy M. Cohen; Eduardo Maayan; Boaz Eitan; Ful-Long Ni; Yen-Hui Joseph Ku; Chih-Yuan Lu; Tim Chang-Ting Chen; Chun-Yu Liao; Chin-Hung Chang; Chung-Kuang Chen; Wen-Chiao Ho; Yite Shih; Wenchi Ting; Wen-Pin Lu
A 4b/cell 1Gb data flash based on a low-cost NROM process technology is achieved. The design includes a two-phase programming algorithm for supporting a fast and accurate threshold-voltage control. The read scheme incorporates a simple error-detection mechanism combined with an accurate drain-side sensing circuit with a built-in offset cancellation
international solid-state circuits conference | 2008
Ran Sahar; Avi Lavan; Eran Geyari; Amit Berman; Itzic Cohen; Ori Tirosh; Kobi Danon; Yair Sofer; Yoram Betser; Amichai Givant; Alexander Kushnarenko; Yaal Horesh; Ron Eliyahu; Eduardo Maayan; Boaz Eitan; Wang Pei Jen; Yan Feng; Lin Ching Yao; Kwon Yi Jin; Kwon Sung Woo; Cai En Jing; Yi Jing Jing; Kim Jong Oh; Yi Guan Jiun
The increasing demand for cost reduction of data storage solutions calls for both cell-size shrink, as well as compressing more bits of data into the storage element. Yet the low cost solution is required to have fast enough write operation to fit density-hungry applications. An 8 Gb data flash storage device based on 4b/cell NROM technology is presented in this paper. A major improvement in write time is accomplished through improvement of programming techniques, erase scheme and sensing methods.
international solid-state circuits conference | 2004
Yair Sofer; M. Edan; Yoram Betser; M. Grossgold; Eduardo Maayan; Boaz Eitan
A 256 Mb flash memory based on 2 b/cell 0.17 /spl mu/m NROM technology supports 90 ns random read access, 66 MHz synchronous read, and 3 /spl mu/s/word programming. This 55 mm/sup 2/ device includes an 8 b embedded microcontroller for program and erase operations, power-up sequence, BIST, and more. The microcontroller executes its code from an NROM-based embedded ROM, performing 30 ns/word read access.
Archive | 2000
Zeev Cohen; Boaz Eitan; Eduardo Maayan
Archive | 2002
Ilan Bloom; Boaz Eitan; Zeev Cohen; David Finzi; Eduardo Maayan
Archive | 2004
Eduardo Maayan; Guy M. Cohen; Boaz Eitan
Archive | 2001
Ilan Bloom; Eduardo Maayan; Boaz Eitan
Archive | 2001
Eduardo Maayan; Boaz Eitan