Eliezer Rosengaus | Researchain

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Featured researches published by Eliezer Rosengaus.

Archive | 1999

System and method for inspecting semiconductor wafers

Eliezer Rosengaus; Steven R. Lange

Archive | 2008

Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions

Kris Bhaskar; Chetana Bhaskar; Ashok Kulkarni; Eliezer Rosengaus; Cecelia Campochiaro; Chris Maher; Brian Duffy; Aneesh Khullar; Alpa Kohli; Lalita A. Balasubramanian; Santosh Bhattacharyya; Mohan Mahadevan

Archive | 2001

Systems and methods for inspection of specimen surfaces

Eliezer Rosengaus; Lydia Young

Archive | 2012

Acquisition of information for a construction site

Eliezer Rosengaus; Ady Levy; Kris Bhaskar

Archive | 2007

Wafer inspection systems and methods for analyzing inspection data

Paul J Sullivan; George Kren; Eliezer Rosengaus; Patrick Huet; Robinson Piramuthu; Martin Plihal; Yan Xiong

Archive | 2002

Illumination delivery system

Chris Bragg; Daniel Scott; Eliezer Rosengaus

Archive | 2004

Edge bead removal inspection by reflectometry

Eliezer Rosengaus

Archive | 2008

Multi-spectral techniques for defocus detection

Eliezer Rosengaus

Archive | 2004

Daisy chained topology

Krishnamurthy Bhaskar; Mark J. Roulo; John S. Taylor; Lawrence R. Miller; Paul T. Russell; Jason Z. Lin; Eliezer Rosengaus; Richard Wallingford; Kishore Bubna

Archive | 2011