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Ashok Kulkarni

KLA-Tencor

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Publication

Featured researches published by Ashok Kulkarni.

Archive | 1997

Software system and method for graphically building customized recipe flowcharts

Manoj Hardikar; Steve Zhou; Richard Shiflett; Ashok Kulkarni

Archive | 2007

Methods and systems for determining a position of inspection data in design data space

Ashok Kulkarni; Brian Duffy; Kais Maayah; Gordon Rouse; Eugene Shifrin

Archive | 2005

Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle

Kenong Wu; David Randall; Kourosh Nafisi; Ramon Ynzunza; Ingrid B. Peterson; Ariel Tribble; Michal Kowalski; Lisheng Gao; Ashok Kulkarni

Archive | 2007

Systems and methods for creating inspection recipes

Brian Duffy; Ashok Kulkarni

Archive | 2008

Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions

Kris Bhaskar; Chetana Bhaskar; Ashok Kulkarni; Eliezer Rosengaus; Cecelia Campochiaro; Chris Maher; Brian Duffy; Aneesh Khullar; Alpa Kohli; Lalita A. Balasubramanian; Santosh Bhattacharyya; Mohan Mahadevan

Archive | 1997

System and method for analyzing semiconductor production data

Manoj Hardikar; Steve Zhou; Richard Shiflett; Ashok Kulkarni

Archive | 1998

Software system and method for extending classifications and attributes in production analysis

Manoj Hardikar; Steve Zhou; Richard Shiflett; Ashok Kulkarni

Archive | 2007

SEMICONDUCTOR DEVICE PROPERTY EXTRACTION, GENERATION, VISUALIZATION, AND MONITORING METHODS

Ashok Kulkarni; Chien-Huei Chen; Cecelia Campochiaro; Richard Wallingford; Yong Zhang; Brian Duffy

Archive | 2004

Flexible hybrid defect classification for semiconductor manufacturing

Patrick Huet; Maruti Shanbhag; Sandeep Bhagwat; Michal Kowalski; Vivekanand Kini; David Randall; Sharon Mccauley; Tong Huang; Jianxin Zhang; Kenong Wu; Lisheng Gao; Ariel Tribble; Ashok Kulkarni; Cecelia Campochiaro

Archive | 2008

Systems and methods for detecting defects on a wafer and generating inspection results for the wafer

Ashok Kulkarni; Santosh Bhattacharyya

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Chien-Huei Chen

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Lisheng Gao

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Saibal Banerjee

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Brian Duffy

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Chien-Huei Adam Chen

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Eugene Shifrin

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Kenong Wu

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Mohan Mahadevan

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Santosh Bhattacharyya

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Songnian Rong

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