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Dive into the research topics where Nick Van Gestel is active.

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Featured researches published by Nick Van Gestel.


International Journal of Precision Technology | 2011

Influence of feature form deviations on CMM measurement uncertainties

Nick Van Gestel; Philip Bleys; Frank Welkenhuyzen; Jean Pierre Kruth

Dimensional quality inspections of high precision parts are often performed by coordinate measuring machines (CMMs) equipped with touch-trigger probes. Features of these parts are then measured with a limited set of points, due to time constraints. This limited sampling has an important influence on the measurement uncertainty because the form deviation of the feature can not be completely assessed. It will not only affect the measurement uncertainty of the form deviation, but also the measurement uncertainties of other feature parameters like size, position and orientation. The quantification of this influence is difficult since the true form deviation is unknown. This paper describes a method, based on Monte Carlo simulations, that allows to determine these measurement uncertainties based on an estimate of the form deviation using a limited set of points. The method is illustrated for circles with theoretical shapes of form deviations, as well as measured shapes.


Measurement | 2012

Automated dimensional inspection planning using the combination of laser scanner and tactile probe

Haibin Zhao; Jean-Pierre Kruth; Nick Van Gestel; Bart Boeckmans; Philip Bleys


Cirp Annals-manufacturing Technology | 2009

Uncertainty determination for CMMs by Monte Carlo simulation integrating feature form deviations

Jean-Pierre Kruth; Nick Van Gestel; Philip Bleys; Frank Welkenhuyzen


Optics and Lasers in Engineering | 2011

Accuracy improvement of laser line scanning for feature measurements on CMM

Igor Bešić; Nick Van Gestel; Jean-Pierre Kruth; Philip Bleys; Janko Hodolic


Proceedings of the 10th CIRP Computer Aided Tolerancing 2007 | 2007

Uncertainty due to limited sampling of circular features on coordinate measuring machines

Nick Van Gestel; Steven Cuypers; Jean-Pierre Kruth; Philip Bleys


Proceedings of the 3rd Workshop on Optical Measurements Techniques for Structures and Systems | 2007

Optical measurement techniques for mobile and large scale dimensional metrology

Wim Cuypers; Nick Van Gestel; André Voet; Jean-Pierre Kruth; Philip Bleys


Proceedings of the 4th International Conference on Optical Measurement Techniques for Structures and Systems | 2009

Evaluation of Measurement Uncertainty Contributors for Vision CMMs

Nick Van Gestel; Frank Welkenhuyzen; Philip Bleys; Jean-Pierre Kruth


Precision Engineering-journal of The International Societies for Precision Engineering and Nanotechnology | 2012

CMM hardware error simulation for uncertainty evaluation

Nick Van Gestel; Philip Bleys; Jean-Pierre Kruth


Proceedings of 4th CIRP International Conference on High Performance Cutting, 2010 | 2010

Evaluation and Implementation of an Integrated Measuring System within a Multi-tasking Machining Centre

Bert Lauwers; Jean-Pierre Kruth; Philip Bleys; Peter Ten Haaf; Stijn Saelen; Nick Van Gestel; Frank Welkenhuyzen; Krist Mielnik


Archive | 2010

Uncertainty determination for CMMs - Don't forget the influence of feature form deviations

Philip Bleys; Nick Van Gestel

Collaboration


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Philip Bleys

Katholieke Universiteit Leuven

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Jean-Pierre Kruth

Katholieke Universiteit Leuven

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Frank Welkenhuyzen

Katholieke Universiteit Leuven

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Steven Cuypers

Katholieke Universiteit Leuven

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Bart Boeckmans

Katholieke Universiteit Leuven

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Bert Lauwers

Katholieke Universiteit Leuven

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Haibin Zhao

Katholieke Universiteit Leuven

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