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Dive into the research topics where Hans-Juergen Rostalski is active.

Publication


Featured researches published by Hans-Juergen Rostalski.


Optical Design and Engineering II | 2005

Use of diffractive optical elements in lithographic projection lenses

Hans-Juergen Rostalski; Alexander Epple; Heiko Feldmann

Projection lenses for high resolution lithography have high NA and work at small wavelengths. In the wavelength regime of VUV (e.g. 193nm), there is a very limited number of optical glasses available, namely fused silica and calcium fluoride. The latter is very expensive and used only sparely, leading to limited possibilities for chromatic correction. In addition to catadioptric approaches, another way to deal with chromatic aberrations is the use of diffractive optical elements (DOEs). They have negative dispersion coupled with positive power and they do not contribute to the Petzval sum. Moreover, it is easy to integrate an aspherical functionality into the structure of the DOE. Usually a DOE is placed close to the aperture stop to correct axial color. The stop of a lithographic projection lens often is located at the largest diameter, causing some serious fabrication difficulties for the DOE. For this reason a class of lenses with intermediate image is of interest. Here, the accessible conjugate of the aperture stop enhances the possibilities to arrange the stop and the DOE. This allows a convenient tradeoff between fabrication challenges and aberration correcting properties. We present different lens designs that take advantage of the named properties of DOEs at high numerical aperture.


Proceedings of SPIE, the International Society for Optical Engineering | 2006

Use of diffractive lenses in lithographic projection lenses

Hans-Juergen Rostalski; Alexander Epple; Heiko Feldmann

Projection lenses for high resolution lithography have high NA and work at small wavelengths. In the wavelength regime of VUV (e.g. 193nm), there is a very limited number of optical glasses available, namely fused silica and calcium fluoride. The latter is very expensive and used only sparely, leading to limited possibilities for chromatic correction. In addition to catadioptric approaches, another way to deal with chromatic aberrations is the use of diffractive optical elements (DOEs). They have negative dispersion coupled with positive power and they do not contribute to the Petzval sum. Moreover, it is easy to integrate an aspherical functionality into the structure of the DOE. Usually a DOE is placed close to the aperture stop to correct axial color. The stop of a lithographic projection lens often is located at the largest diameter, causing some serious fabrication difficulties for the DOE. For this reason a class of lenses with intermediate image is of interest. Here, the accessible conjugate of the aperture stop enhances the possibilities to arrange the stop and the DOE. This allows a convenient tradeoff between fabrication challenges and aberration correcting properties. We present different lens designs that take advantage of the named properties of DOEs at high numerical aperture.


Archive | 2003

Refractive projection objective for immersion lithography

Hans-Juergen Rostalski; Wilhelm Ulrich


Archive | 2008

Microlithographic projection exposure apparatus

Aurelian Dodoc; Karl Heinz Schuster; Joerg Mallmann; Wilhelm Ulrich; Hans-Juergen Rostalski


Archive | 2005

Projection objective for a microlithographic projection exposure apparatus

Hans-Juergen Rostalski; Aurelian Dodoc


Archive | 2005

Projection system with compensation of intensity variations and compensation element therefor

Patrick Scheible; Alexandra Pazidis; Reiner Garreis; Michael Totzeck; Heiko Feldmann; Paul Graeupner; Hans-Juergen Rostalski; Wolfgang Singer


Archive | 2004

Refractive projection objective

Hans-Juergen Rostalski; Karl-Heinz Schuster; Russell Hudyma; Wilhelm Ulrich; Rolf Freimann


Archive | 2003

Refractive projection lens

Wilhelm Ulrich; Russell Hudyma; Hans-Juergen Rostalski; Karl-Heinz Schuster


Archive | 2005

Projection objective of a microlithographic exposure apparatus

Karl-Heinz Schuster; Hans-Juergen Rostalski; Aurelian Dodoc


International Optical Design Conference (2002), paper IMD3 | 2002

The development of dioptric projection lenses for DUV lithography

Wilhelm Ulrich; Hans-Juergen Rostalski; Russell Hudyma

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