Hao Nham
Bell Labs
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Featured researches published by Hao Nham.
design automation conference | 1984
Chin-Fu Chen; Chi-Yuan Lo; Hao Nham; Prasad Subramaniam
This paper describes the second generation MOTIS mixed-mode simulator. In particular, It extends the current modeling capabilities to include resistors, floating capacitors, and bidirectional transmission gates. It employs a relaxation algorithm with local time-step control for timing simulation, and a switch level approach for unit delay simulation. It provides logic and timing verification for general MOS circuits in a mixed-mode environment. The new simulator is being used for production chips, and it is more accurate, flexible, and efficient than the existing MOTIS mixed-mode simulator.
design automation conference | 1980
Hao Nham; Ajoy K. Bose
This paper describes a multiple delay simulator for MOS LSI circuits. The basic primitives for this simulator are MOS transistor structures where the transistors are evaluated logically. Integer rise and fall delays are associated with each transition and these delays are computed automatically based on device characteristics and circuit capacitances. The simulator has been extensively used for the design verification of production LSI chips.
design automation conference | 1982
Ajoy K. Bose; Patrick Kozak; Chi-Yuan Lo; Hao Nham; Ernesto Pacas-Skewes; Kwok W. Wu
This paper describes a fault simulator for MOS LSI circuits. The basic primitives for this simulator are MOS transistor structures where the transistors are evaluated logically. The simulator provides the capability of modeling and simulating both the classical input/output stuck-at faults and the non-classical transistor stuck-on and stuck-open faults.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 1987
Chi-Yuan Lo; Hao Nham; Ajoy K. Bose
In this paper, we will present algorithms developed for an advanced fault simulation system in the MOTIS simulation environment. In particular, the algorithm to perform fault modeling and collapsing is first reviewed. Efficient algorithms to perform fault simulation are discussed in terms of fault list manipulation and primitive evaluation. The simulator realizes a speed gain factor of 787 to 2088 over serial fault simulation. Special emphasis is on an innovative fast unit delay fault simulation algorithm that achieves an additional 33-39-percent improvement in speed and 20-28-percent improvement in memory usage.
design automation conference | 1980
Vishwani D. Agrawal; Ajoy K. Bose; Patrick Kozak; Hao Nham; Ernesto Pacas-Skewes
To provide flexibility and efficiency in logic and timing verification of MOS VLSI circuits, it is desirable that various portions of a circuit can be described and simulated at appropriate levels of detail. Such a capability is provided by the Mixed-Mode Simulator described here. This simulator allows different elements of a circuit to be modeled and simulated at different levels of detail. The modeling levels are MOS transistor level, logic gate level and functional level. The simulation levels are timing, multiple delay and unit delay. The simulator is being used on production LSI chips and its performance is discussed.
design automation conference | 1983
Chi-Yuan Lo; Hao Nham; Ajoy K. Bose
This paper describes a data structure to represent the driver-load configurations in MOS circuits, which is used universally in the MOTIS simulation environment. In particular, the data structure is used in mixed-mode evaluation including timing, and multiple/unit delay. Other applications include automatic delay calculation, transistor fault modeling, fault collapsing, and fault simulation.
design automation conference | 2005
Nic Mokhoff; Yervant Zorian; Kamalesh N. Ruparel; Hao Nham; Francesco Pessolano; Kee Sup Kim
Different applications for todays chips require different type of optimizations and thus the need to adopt emerging products and solutions to meet such requirements. Optimizing for low power, for high yield, for reduced soft error or minimal bring up time necessitate adequate trade-off analysis and technical/business decision making by management. The lead managers in this session will discuss todays emerging solutions and their economic impact.
Archive | 1981
Vishwani D. Agrawal; Ajoy K. Bose; Patrick Kozak; Hao Nham; Ernesto Pacas-Skewes
Archive | 2016
Prasad Subramaniam; Hao Nham; Rakesh Chadha; Ferran Martorell
Archive | 2016
Prasad Subramaniam; Hao Nham; Rakesh Chadha; Ferran Martorell