Vishwani D. Agrawal

A partial scan method for sequential circuits with feedback

A method of partial scan design is presented in which the selection of scan flip-flops is aimed at breaking up the cyclic structure of the circuit. Experimental data are given to show that the test generation complexity may grow exponentially with the length of the cycles in the circuit. This complexity grows only linearly with the sequential depth. Graph-theoretic algorithms are presented to select a minimal set of flip-flops for eliminating cycles and reducing the sequential depth. Tests for the resulting circuit are generated by a sequential logic test generator. An independent control of the scan clock allows insertion of scan sequences within the vector sequence produced by the test generator. An independent control of the scan clock allows insertion of scan sequences within the vector sequences produced by the test generator. 98% fault coverage is obtained for a 5000-gate circuit by scanning just 5% of the flip-flops. >

Scheduling tests for VLSI systems under power constraints

This paper considers the problem of testing VLSI integrated circuits in minimum time without exceeding their power ratings during test. We use a resource graph formulation for the test problem. The solution requires finding a power-constrained schedule of tests. Two formulations of this problem are given as follows: (1) scheduling equal length tests with power constraints and (2) scheduling unequal length tests with power constraints. Optimum solutions are obtained for both formulations. Algorithms consist of four basic steps. First, a test compatibility graph is constructed from the resource graph. Second, the test compatibility graph is used to identify a complete set of time compatible tests with power dissipation information associated with each test. Third, from the set of compatible tests, lists of power compatible tests are extracted. Finally, a minimum cover table approach is used to find an optimum schedule of power compatible tests.

A tutorial on built-in self-test. I. Principles

An overview of built-in self-test (BIST) principles and practices is presented. The issues and economics underlying BIST are discussed, and the related hierarchical test structures are introduced. The fundamental BIST concepts of pattern generation and response analysis are explained. Linear feedback shift register theory is reviewed. >

Chip Layout Optimization Using Critical Path Weighting

A chip layout procedure for optimizing the performance of critical timing paths in a synchronous digital circuit is presented. The procedure uses the path analysis data produced by a static timing analysis program to generate weights for critical nets on clock and data paths. These weights are then used to bias automatic placement and routing in the layout program. This approach is shown to bring the performance of the chip significantly closer to that of an ideal layout which is assumed to have no delay due to routing between cells.

A transitive closure algorithm for test generation

A transitive-closure-based test generation algorithm is presented. A test is obtained by determining signal values that satisfy a Boolean equation derived from the neural network model of the circuit incorporating necessary conditions for fault activation and path sensitization. The algorithm is a sequence of two main steps that are repeatedly executed: transitive closure computation and decision-making. A key feature of the algorithm is that dependences derived from the transitive closure are used to reduce ternary relations to binary relations that in turn dynamically update the transitive closure. The signals are either determined from the transitive closure or are enumerated until the Boolean equation is satisfied. Experimental results on the ISCAS 1985 and the combinational parts of ISCAS 1989 benchmark circuits are presented to demonstrate efficient test generation and redundancy identification. Results on four state-of-the-art production VLSI circuits are also presented. >

A tutorial on built-in self-test. 2. Applications

For pt.1 see ibid., vol.10, no.1, p.73-82 (1993). The hardware structures and tools used to implement built-in self-test (BIST) pattern generation and response analysis concepts are reviewed. The authors describe testing approaches for general and structured logic, including ROMs, RAMs, and PLAs. They illustrate BIST techniques with real-world examples. >

Statistical Fault Analysis

Statistical Fault Analysis, or Stafan, is proposed as an alternative to fault simulation of digital circuits. This method defines Controllabilities and observabilities of circuit nodes as probabilities estimated from signal statistics of fault-free simulation. Special Procedures deal with these quantities at fanout and feedback nodes. The computed probabilities are used to derive unbiased estimates of fault detection probabilities and overall fault coverage for the given set of input vectors. Among Stafans advantages, fault coverage and the undetected fault data obtained for actual circuits are shown to agree within five percent of fault simulator results, yet CPU time and memory demands fall far short of those required in fault simulation. The Computational complexity added to a fault-free simulator by Stafan grows only linearly with the number of circuit nodes.

Design of a dichroic Cassegrain subreflector

The design of a dichroic subreflector for a dual-frequency reflector antenna is described. This antenna consists of a Ku -band Cassegrain feed requiring the subreflector surface to be highly reflective at 13-15 GHz and a primary focus S -band feed requiring the subreflector to be transparent at 2.0-2.3 GHz. Such a performance is achieved by a surface of crossed dipoles printed on a dielectric sheet. The influence of parameters, dipole length, width and spacing, and the dielectric constant and thickness of the sheet on the reflection and transmission coefficients is experimentally evaluated. An analysis based upon the Floquent mode theory is shown to correctly predict the experimental results. The construction of a hyperbolic subreflector using the selected surface parameters is briefly described. As compared to a solid subreflector of identical shape, this dichroic subreflector produced a negligible loss (less than 0.1 dB) over a 13-15 GHz band. At the S band the loss was less than 0.2 dB over narrow selected bands and the axial ratio deterioration was also no more than 0.2 dB.

Designing circuits with partial scan

In this scan design methodology, only selected faults are targeted for detection. These faults are those not detected by the designers functional vectors. The test generator decides exactly which flip-flops should be scanned using one of two methods. In the first method, all possible tests are generated for each target fault, and the set of tests requiring the fewest flip-flops is selected. In the second method, only one test is generated for each fault, and the use of flip-flops is avoided as much as possible during test generation. Examples of actual VLSI circuits show a savings of at least a 40% in full-scan overhead.<<ETX>>

Segment delay faults: a new fault model

We propose a segment delay fault model to represent any general delay defect ranging from a spot defect to a distributed defect. The segment length, L, is a parameter that can be chosen based on available statistics about the types of manufacturing defects. Once L is chosen, the fault list contains all segments of length L and paths whose entire lengths are less than L. Both rising and falling transitions at the origin of segments are considered. Choosing segments of a small length can prevent an explosion of the number of faults considered. At the same time, a defect over a segment may be large enough to affect any path passing through it. We present an efficient algorithm to compute the number of segments of any possible length in a circuit. We define various classes of segment delay fault tests-robust, transition, and non-robust-that offer a trade-off between fault coverage and quality.