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electronic components and technology conference | 1995

Sub-nanohenry inductance measurement using a zero-parasitic-inductance probe system

Tatsuya Nagata; Hiroya Shimizu; Atsushi Nakamura; H. Fukumoto

A new inductance measurement method of a sub-nanohenry order is proposed using an LCR meter. Since parasitic inductances of probes usually decreases the measurement accuracy, we developed two types of special probes to minimize such parasitic inductances. The new measurement methods have special merits, such as separate measurements of each trace and a high spatial resolution. They also enable measurements of inductances not only for simple traces, but also for combined trace-and-sheet conductor systems. The results measured proved to be in good agreement with our electro-magnetic simulator. The eddy current effect was successfully demonstrated by using this method.


Archive | 1997

Memory module and an IC card

Tatsuya Nagata; Hiroya Shimizu; Atsushi Nakamura; Hideshi Fukumoto; Toshio Sugano


Archive | 2002

Semiconductor device testing apparatus and method for manufacturing the same

Masatoshi Kanamaru; Yoshishige Endo; Takanori Aono; Ryuji Kohno; Hiroya Shimizu; Naoto Ban; Hideyuki Aoki


Archive | 2006

Inductance analysis system and method and program therefor

Mitsuaki Katagiri; Takashi Iida; Hiroya Shimizu; Satoshi Isa


Archive | 2001

Semiconductor device testing apparatus and semiconductor device manufacturing method using it

Ryuji Kohno; Hideo Miura; Masatoshi Kanamaru; Hiroya Shimizu; Naoto Ban


Archive | 2001

Inspection apparatus of semiconductor device

Hideyuki Aoki; Ryuji Kono; Toshio Miyatake; Tatsuya Nagata; Hiroya Shimizu; 俊雄 宮武; 達也 永田; 竜治 河野; 浩也 清水; 英之 青木


Archive | 2011

Power storage system provided with batteries

Takeshi Uchida; 内田 丈; Naruhiko Kasai; 笠井 成彦; Masami Shida; 正実 志田; Hiroya Shimizu; 浩也 清水; Yoshikazu Kanazawa; 金澤 義一; Shin Yamauchi; 晋 山内


Archive | 2002

Packaging device for holding a plurality of semiconductor devices to be inspected

Ryuji Kohno; Hiroya Shimizu; Masatoshi Kanamaru; Atsushi Hosogane; Toshio Miyatake; Hideo Miura; Tatsuya Nagata; Yoshishige Endo; Masaaki Namba; Yuji Wada


Archive | 2007

METHOD FOR DESIGNING DEVICE, SYSTEM FOR AIDING TO DESIGN DEVICE, AND COMPUTER PROGRAM PRODUCT THEREFOR

Mitsuaki Katagiri; Satoshi Nakamura; Takashi Suga; Hiroya Shimizu; Satoshi Isa; Satoshi Itaya; Yukitoshi Hirose


Archive | 2005

INDUCTANCE ANALYSIS SYSTEM, METHOD AND PROGRAM

Takashi Iida; Satoshi Isa; Mitsuaki Katagiri; Hiroya Shimizu; 聡 伊佐; 浩也 清水; 光昭 片桐; 敬 飯田

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