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Featured researches published by Toshio Miyatake.


IEEE Transactions on Applied Superconductivity | 2004

Shear/compressive strength of GFRP under mixed load condition at low temperature

Takayuki Suzuki; Saburo Usami; Toshio Miyatake

Insulation of superconducting magnet systems requires excellent electrical insulating properties, compressive strength and flexibility so that it can bear the compressive stress of the electromagnetic force and the shear stress caused by the deformation of each conductor in these magnets. GFRP is suitable for these insulation systems and most superconducting magnet systems use it. Although the interlaminar shear strength of GFRP is about a tenth of its compressive strength, this strength increases under a combination of stresses. GFRP strengths under shear/compressive loading are specified for optimum designs. Therefore, we can apply GFRP against shear/compressive loading for which static and fatigue strengths are the dominant factors in magnet life assessment. The coefficient of friction of the surface affects the static and fatigue behavior at low temperature. Two types of tests were carried out to simulate the combined stresses, and shear/compressive static and fatigue tests were performed at 77 K on GFRP. Employing different angle test fixtures, GFRP specimens were loaded with various levels of shear and compressive stress. We evaluated the strength of insulators that sustain compressive and frictional shear stresses to take into account the stress redistributions for cases both with and without the occurrence of surface slips. A new criterion for the shear/compressive static and fatigue failure is proposed in this study.


Archive | 2003

Operation monitoring system and sensor

Jinichiro Goto; Toshio Miyatake; Saburo Usami; 三郎 宇佐美; 俊雄 宮武; 仁一郎 後藤


Archive | 2008

Apparatus and method for inspecting semiconductor device

Hideyuki Aoki; Takanori Aono; Naoto Ban; Kiju Endo; Masatoshi Kanamaru; Ryuji Kono; Toshio Miyatake; 直人 伴; 俊雄 宮武; 竜治 河野; 喜重 遠藤; 昌敏 金丸; 英之 青木; 宇紀 青野


Archive | 2002

Semiconductor-device inspecting apparatus and a method for manufacturing the same

Masatoshi Kanamaru; Yoshishige Endo; Takanorr Aono; Ryuji Kohno; Toshio Miyatake; Hideyuki Aoki; Naoto Ban


Archive | 2001

Inspection apparatus of semiconductor device

Hideyuki Aoki; Ryuji Kono; Toshio Miyatake; Tatsuya Nagata; Hiroya Shimizu; 俊雄 宮武; 達也 永田; 竜治 河野; 浩也 清水; 英之 青木


Archive | 2002

Packaging device for holding a plurality of semiconductor devices to be inspected

Ryuji Kohno; Hiroya Shimizu; Masatoshi Kanamaru; Atsushi Hosogane; Toshio Miyatake; Hideo Miura; Tatsuya Nagata; Yoshishige Endo; Masaaki Namba; Yuji Wada


Archive | 2005

Generator and method of manufacturing same

Toshio Miyatake; Juichi Enyama


Archive | 2002

Semiconductor device and test device for same

Toshio Miyatake; Tatsuya Nagata; Hiroya Shimizu; Ryuji Kohno; Hideyuki Aoki


Archive | 2000

Method for producing semiconductor device and apparatus usable therein

Ryuji Kohno; Hiroya Shimizu; Masatoshi Kanamaru; Atsushi Hosogane; Toshio Miyatake; Hideo Miura; Tatsuya Nagata; Yoshishige Endo; Masaaki Namba; Yuji Wada


Transactions of the Japan Society of Mechanical Engineers. A | 2005

Laminar Strength of GFRP under Combined Axial and Shear Loadings

Toshio Miyatake; Saburo Usami; Takayuki Suzuki

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