Hisanori Aikawa

Lower-current and fast switching of a perpendicular TMR for high speed and high density spin-transfer-torque MRAM

We investigate extremely low programming current and fast switching time of a perpendicular tunnel-magnetoresistance (P-TMR) for spin-transfer torque using a P-TMR cell of 50 nm-diameter. A L10-crystalline ordered alloy is used as a free layer that has excellent thermal stability and a damping constant of about 0.03. The programming current of 49 uA and the switching time of 4 nsec are also demonstrated.

Effect of added Cu on disorder-order transformation of L1/sub 0/-FePt

The L1/sub 0/-FePt ordered phase is formed at lower annealing temperature by addition of Cu. FePtCu films start ordering at 300/spl deg/C or a lower temperature, whereas FePt and FePtAg films are still disordered alloys after annealing at 300/spl deg/C. The results of X-ray diffraction indicate that FePt and the added Cu form an FePtCu ternary alloy, whereas FePtAg decomposes into FePt and Ag phases in the disorder-order transformation. From thermodynamic considerations, it is concluded that reduction of the ordering temperature of FePt is due to the formation of an FePtCu solid solution.

Reduction of switching current distribution in spin transfer magnetic random access memories

In this paper, the switching current distribution by spin transfer torque is investigated for CoFeB∕MgO∕CoFeB magnetic tunnel junctions (MTJs). The distribution of the spin transfer switching current for a MTJ with junction size of 85×110nm2 is 16% when the duration of applied pulse current is 5ms. In the case of magnetization reversal with magnetic field induced by current with 5ms pulse duration, the distribution of the switching field is 8.3%. According to our micromagnetic simulation, it is found that the spin transfer current switching seems to exhibit a nonuniform magnetization reversal process, whereas the magnetization switching by the magnetic field exhibits a uniform magnetization reversal process. This leads to the broader distribution related to the repeatability.In this paper, the switching current distribution by spin transfer torque is investigated for CoFeB∕MgO∕CoFeB magnetic tunnel junctions (MTJs). The distribution of the spin transfer switching current for a MTJ with junction size of 85×110nm2 is 16% when the duration of applied pulse current is 5ms. In the case of magnetization reversal with magnetic field induced by current with 5ms pulse duration, the distribution of the switching field is 8.3%. According to our micromagnetic simulation, it is found that the spin transfer current switching seems to exhibit a nonuniform magnetization reversal process, whereas the magnetization switching by the magnetic field exhibits a uniform magnetization reversal process. This leads to the broader distribution related to the repeatability.

Design and process integration for high-density, high-speed, and low-power 6F/sup 2/ cross point MRAM cell

A cross point (CP) cell with hierarchical bit line architecture was proposed for magnetoresistive random access memory (MRAM) based in Y. Shimizu et al. (2004). The new CP cell has a potential high density of 6F/sup 2/ and a faster access time than the conventional CP cell. A cell layout design to realize 6F is proposed and associated issues are resolved. Further, a 1Mb MRAM chip based on this structure has been fabricated utilizing 0.13 /spl mu/m CMOS technology and 0.24/spl times/0.48 /spl mu/m/sup 2/ magnetic tunnel junction (MTJ) sandwiched with the most efficient yoke wires ever reported. The access time of 250 ns and 1.5 V operations are successfully demonstrated with the integrated 1Mb chip.

Effect of Self-Heating on Time-Dependent Dielectric Breakdown in Ultrathin MgO Magnetic Tunnel Junctions for Spin Torque Transfer Switching Magnetic Random Access Memory

Spin torque transfer switching magnetic random access memory (Spin-MRAM) using MgO-magnetic tunnel junction (MTJ) is considered to be the most promising candidate for high-density, high-speed, and non-volatile RAM. Notwithstanding its excellent potential, the breakdown mechanism of MgO-MTJ has not been well understood although a thorough understanding is essential for commercialization of Spin-MRAM. In this paper, we demonstrate for the first time the modeling of dielectric breakdown phenomena of MgO-MTJ by time-dependent dielectric breakdown (TDDB) measurement concerning the effect of self-heating using simulation and conclude that E-model with the effect of self-heating at MgO-MTJ during current stress (power) removed gives the best fitting as a degradation model of MgO-MTJ ultrathin dielectrics.

Compact model for layout dependent variability

We have developed a compact model which deals with MOSFET characteristic variations arising from design layout dependences. It treats many stress related variations and their interactions that are especially important in 45 nm technology node. It is demonstrated that the model can predict MOSFET characteristics used in standard cells with high accuracy.

Resistance drift of MgO magnetic tunnel junctions by trapping and degradation of coherent tunneling

Magnetoresistive Random Access Memory (MRAM) is a promising device for high-density (over Gbits scale), high-speed (equal to DRAM or better) non-volatile RAM, and much research has been done over several years with a view to overcoming the problems regarding practical use. Spin Torque Transfer switching MRAM (STT-MRAM) is considered to be the most promising candidate and there already are some papers on this new device. MgO is expected to be the best material for magnetic tunnel junction (MTJ) of STT-MRAM, because MgO-MTJ is known to show large Magnetoresistance (MR) and enhance spin polarization by the coherent tunneling effect, resulting in decrease of writing current of MTJ. MgO-MTJ has been shown to be an excellent barrier with little resistance drift compared with MTJ using alumina. Notwithstanding its excellent potential, the degradation mechanism of MgO-MTJ has not been well understood. In this paper, we will demonstrate for the first time the degradation of coherent tunneling and trapping phenomena of MgO-MTJ and discuss its mechanism.

Magnetic and Writing Properties of Clad Lines Used in a Toggle MRAM

We fabricated toggle magnetic random access memories with clad writing lines. First, we evaluated the structures and magnetic properties of sputter-deposited cladding layers. The substrate bias during the deposition affected not only the sidewall coverage, but also the crystallinity and magnetic properties of the cladding. The optimized clad lines reduced the writing current to as low as 50% of that of unclad lines. Moreover, the writing current deviation divided by the average current of magnetic tunnel junction cells with clad lines was as low as that with unclad lines. Using the optimized clad lines, we constructed memory arrays with a large operating margin and reduced switching current

Switching Current Fluctuation and Repeatability for MRAM With Propeller-Shape MTJ

The writing region and the repeatability of the function test and switching current fluctuation of magnetoresistive random access memory (MRAM) with a propeller shape magnetic tunnel junction (MTJ) array is evaluated. The effect of the write sequence is also investigated. The writing region is larger when the easy-axis field pulse is turned on prior to the hard-axis field than that in the case of the opposite sequence. However, the total margin in the latter sequence is larger after the repeated tests because of the smaller switching field fluctuation. The average 1-sigma value of the switching field fluctuation is 1.7%, which is mainly caused by the thermal fluctuation. The probability of the write error is estimated to be less than 10-16 by the bit line writing region and the thermal stability

Estimation of spin transfer torque effect and thermal activation effect on magnetization reversal in CoFeB∕MgO∕CoFeB magnetoresistive tunneling junctions

In the CoFeB∕MgO∕CoFeB magnetoresistive tunneling junctions, the bias-dependent magnetic switching curves are investigated and the spin transfer torque effect and the thermal activation effect on the magnetic switching are estimated. The different switching behaviors at the positive and negative biases were observed, which are the asymmetric changes of the coercive force and the shift field. In order to investigate the asymmetric reduction of the coercive force according to the bias direction, the magnetic excitation effect due to the hot electron was introduced. Consequently, from the analysis by using the current versus magnetic field phase diagram, the asymmetric reduction of the coercive force at the positive and negative biases was explained quantitatively by the relationship between the thermal activation effect due to the Joule heating and the magnetic excitation effect due to the hot electron.