Hyung-Dong Kim

Method and apparatus for controlling a high voltage generator in a wafer burn-in test

Pump circuits and methods for integrated circuits including first and second oscillators and first and second pumps

A 256m Dram With Simplified Register Control For Low Power Self Refresh And Rapid Burn-in

Semiconductor memory device for enhancing bitline precharge time

Semiconductor memory device and voltage level control method thereof

Integrated circuit memory devices having metal straps to improve word line driver reliability

Input buffer with wide input voltage range

Semiconductor memory device capable of reducing data test time in pipeline

Semiconductor memory device having mesh-type structure of precharge voltage line

Semiconductor memory device having redundancy circuit capable of improving redundancy efficiency