Jakub Skibinski

Imaging resolution of AFM with probes modified with FIB.

This study concerns imaging of the structure of materials using AFM tapping (TM) and phase imaging (PI) mode, using probes modified with focused ion beam (FIB). Three kinds of modifications were applied - thinning of the cantilever, sharpening of the tip and combination of these two modifications. Probes shaped in that way were used for AFM investigations with Bruker AFM Nanoscope 8. As a testing material, titanium roughness standard supplied by Bruker was used. The results show that performed modifications influence the oscillation of the probes. In particular thinning of the cantilever enables one to acquire higher self-resonant frequencies, which can be advantageous for improving the quality of imaging in PI mode. It was found that sharpening the tip improves imaging resolution in tapping mode, which is consistent with existing knowledge, but lowered the quality of high frequency topography images. In this paper the Finite Element Method (FEM) was used to explain the results obtained experimentally.

High-resolution computed microtomography for the characterization of a diffusion tensor imaging phantom

This paper addresses the issue of the quantitative characterization of the structure of the calibration model (phantom) for b-matrix spatial distribution diffusion tensor imaging (BSD-DTI) scanners. The aim of this study was to verify manufacturing assumptions of the structure of materials, since phantoms are used for BSD-DTI calibration directly after manufacturing. Visualization of the phantoms’ structure was achieved through optical microscopy and high-resolution computed microtomography (µCT). Using µCT images, a numerical model of the materials structure was developed for further quantitative analysis. 3D image characterization was performed to determine crucial structural parameters of the phantom: porosity, uniformity and distribution of equivalent diameter of capillary bundles. Additionally calculations of hypothetical flow streamlines were also performed based on the numerical model that was developed. The results obtained in this study can be used in the calibration of DTI-BST measurements. However, it was found that the structure of the phantom exhibits flaws and discrepancies from the assumed geometry which might affect BSD-DTI calibration.

Numerical simulations of epitaxial growth process in MOVPE reactor as a tool for design of modern semiconductors for high power electronics

In the present study numerical simulations of epitaxial growth of gallium nitride in Metal Organic Vapor Phase Epitaxy reactor AIX-200/4RF-S is addressed. Epitaxial growth means crystal growth that progresses while inheriting the laminar structure and the orientation of substrate crystals. One of the technological problems is to obtain homogeneous growth rate over the main deposit area. Since there are many agents influencing reaction on crystal area such as temperature, pressure, gas flow or reactor geometry, it is difficult to design optimal process. According to the fact that its impossible to determine experimentally the exact distribution of heat and mass transfer inside the reactor during crystal growth, modeling is the only solution to understand the process precisely. Numerical simulations allow to understand the epitaxial process by calculation of heat and mass transfer distribution during growth of gallium nitride. Including chemical reactions in numerical model allows to calculate the growth rate of the substrate and estimate the optimal process conditions for obtaining the most homogeneous product.

Design of Reservoir Recognition Technique Component - Open Porosity in Non-Polarizing Electrodes

In the present study modeling of permeability of open-porosity ceramic materials used in non-polarizing electrodes is addressed. The structure of the material filling the electrode determines the infiltration of the ceramic structure by electrolyte, which influences the efficiency of the electrodes. The composition of electrode material was characterized with Scanning Electron Microscope Hitachi S3500N with EDS detector and the structure was determined with use of XRadia XCT400 tomograph . The complex geometry of porous materials has been designed using procedure based on Laguerre-Voronoi tessellations (LVT). A set of porous structures with different geometrical features has been developed using LVT algorithm. The approach used here allows to investigate the influence of geometrical features such pore size variation on the permeability of studied materials. Pressure drop characteristics of the developed structures has been analyzed using finite volume method (FVM). The results show that permeability of porous materials is strongly related with distribution of pore size. The study exhibits the utility of developed design procedure for optimization of non-polarizing electrodes performance.