John Schumann

Soft-error resilience of the IBM POWER6 processor

The error detection and correction capability of the IBM POWER6™ processor enables high tolerance to single-event upsets. The soft-error resilience was tested with proton beam- and neutron beam-induced fault injection. Additionally, statistical fault injection was performed on a hardware-emulated POWER6 processor simulation model. The error resiliency is described in terms of the proportion of latch upset events that result in vanished errors, corrected errors, checkstops, and incorrect architected states.

Statistical Fault Injection

A method for statistical fault injection (SFI) into arbitrary latches within a full system hardware-emulated model is validated against particle-beam-accelerated SER testing for a modern microprocessor. As performed on the IBM POWER6 microprocessor, SFI is capable of distinguishing between error handling states associated with the injected bit flip. Methodologies to perform random and targeted fault injection are presented.

A unified methodology for pre-silicon verification and post-silicon validation

The growing importance of post-silicon validation in ensuring functional correctness of high-end designs increases the need for synergy between the pre-silicon verification and post-silicon validation. We propose a unified functional verification methodology for the pre- and post-silicon domains. This methodology is based on a common verification plan and similar languages for test-templates and coverage models. Implementation of the methodology requires a user-directable stimuli generation tool for the post-silicon domain. We analyze the requirements for such a tool and the differences between it and its pre-silicon counterpart. Based on these requirements, we implemented a tool called Threadmill and used it in the verification of the IBM POWER7 processor chip with encouraging results.

Reaching coverage closure in post-silicon validation

Obtaining coverage information in post-silicon validation is a difficult task. Adding coverage monitors to the silicon is costly in terms of timing, power, and area, and thus even if feasible, is limited to a small number of coverage monitors. We propose a new method for reaching coverage closure in post-silicon validation. The method is based on executing the post-silicon exercisers on a pre-silicon acceleration platform, collecting coverage information from these runs, and harvesting important test templates based on their coverage. This method was used in the verification of IBMs POWER7 processor. It contributed to the overall high-quality verification of the processor, and specifically to the post-silicon validation and bring-up.

Leveraging pre-silicon verification resources for the post-silicon validation of the IBM POWER7 processor

The growing importance of post-silicon validation in ensuring functional correctness of high-end designs has increased the need for synergy between the pre-silicon verification and post-silicon validation. This synergy starts with a common verification plan. It continues with common verification goals and shared tools and techniques. This paper describes our experience in improving this synergy in the pre- and post-silicon verification of IBMs POWER7 processor chip and by leveraging pre-silicon methodologies and techniques in the post-silicon validation of the chip.

Functional verification of the IBM POWER7 microprocessor and POWER7 multiprocessor systems

This paper describes the methods and techniques used to verify the POWER7® microprocessor and systems. A simple linear extension of the methodology used for POWER4®, POWER5®, and POWER6® was not possible given the aggressive design point and schedule of the POWER7 project. In addition to the sheer complexity of verifying an eight-core processor chip with scalability to 32 sockets, central challenges came from the four-way simultaneous multithreading processor core, a modular implementation structure with heavy use of asynchronous interfaces, aggressive memory subsystem design with numerous new reliability, availability, and serviceability (RAS) advances, and new power management and RAS mechanisms across the chip and the system. Key aspects of the successful verification project include a systematic application of IBMs random-constrained unit verification, unprecedented use of formal verification, thread-scaling support in core verification, and a consistent use of functional coverage across all verification disciplines. Functional coverage instrumentation, which is combined with the use of the newest IBM hardware simulation accelerator platform, enabled coverage-driven development of postsilicon exercisers in preparation of bring-up, a foundation for the desired systematic linkage of presilicon and postsilicon verification. RAS and power management verification also required new approaches, extending these disciplines to span all the way from the unit level to the end-to-end scenarios using the hardware accelerators.

Solutions to IBM POWER8 verification challenges

This paper describes methods and techniques used to verify the POWER8™ microprocessor. The base concepts for the functional verification are those that have been already used in POWER7® processor verification. However, the POWER8 design point provided multiple new challenges that required innovative solutions. With approximately three times the number of transistors available, compared to the POWER7 processor chip, functionality was added by putting additional enhanced cores on-chip and by developing new features that intrinsically require more software interaction. The examples given in this paper demonstrate how new tools and the continuous improvement of existing methods addressed these verification challenges.