Jong-Hoon Jung

A 14 nm FinFET 128 Mb SRAM With V

Two 128 Mb dual-power-supply SRAM chips are fabricated in a 14 nm FinFET technology. A 0.064 μm2 and a 0.080 μm2 6T SRAM bitcells are designed for high-density (HD) and high-performance (HP) applications. To improve VMIN of the high-density SRAM, a negative bitline scheme (NBL) is adopted as a write-assist technique. Then, the disturbance-noise reduction (DNR) scheme is proposed as a read-assist circuit to improve the VMIN of the high-performance SRAM. The 128 Mb 6T-HD SRAM test-chip is fully demonstrated featuring 0.50 VMIN with 200 mV improvement by NBL, and 0.47 VMIN for the 128 Mb 6T-HP with 40 mV improvement by the DNR. Improved VMIN reduces 45.4% and 12.2% power-consumption of the SRAM macro with the help of each assist circuit, respectively.

_{\rm MIN}

The power consumption of a mobile application processor (AP) is strongly limited by the SRAM minimum operating voltage, VMIN [1], since the 6T bit cell must balance between write-ability and bit cell stability. However, the SRAM VMIN scales down gradually with advanced process nodes due to increased variability. This is evident with the quantized device-width and limited process-knobs of a FinFET technology, which has greatly affected SRAM design [2-4]. Therefore, assist-circuits are more crucial in a FinFET technology to improve VMIN, which in turn adds to the Power, Performance, and Area (PPA) gain of SRAM.

Enhancement Techniques for Low-Power Applications

We propose the new 240Hz driving method that includes black frame insertion, LED BLU(back light unit) control and shutter glasses control to reduce crosstalk caused mainly by slow LC response and data scanning driving method. As a result, it realizes 240Hz Full HD 3D LCD TV with average crosstalk about 1% level.

17.1 A 10nm FinFET 128Mb SRAM with assist adjustment system for power, performance, and area optimization

This paper presents an automated technique to perform SRAM wide statistical analysis in presence of process variability. The technique is implemented in a prototype tool and is demonstrated on several 45 and 32nm industry-grade SRAM vehicles. Selected case studies show how this approach successfully captures non-trivial statistical interactions between the cells and the periphery, which remain uncovered when only using statistical electrical simulations of the critical path or applying a digital corner approach. The presented tool provides the designer with valuable information on what performance metrics to expect, if manufactured. Since this feedback takes place in the design phase, a significant reduction in development time and cost can be achieved.

51.2: New 240Hz Driving Method for Full HD & High Quality 3D LCD TV

Two 128 Mb 6T SRAM test chips are implemented in a 10 nm FinFET technology. A 0.040 μm2 6T SRAM bitcell is designed for high density (HD), and 0.049 μm2 for high performance (HP). The various SRAM assist schemes are explored to evaluate the power, performance, and area (PPA) gain, and the figure-of-merit (FOM) is induced by the minimum operating voltage (VMIN) and assist overheads. The dual-transient wordline scheme is proposed to improve the VMIN by 47.5 mV for the 128 Mb 6T-HP SRAM. The suppressed bitline scheme with negative bitline improves the VMIN by 135 mV for the 128 Mb 6T-HD SRAM. The FOM of PPA gain evaluates the optimum SRAM assist for the different bitcells based on the applications.

Statistical SRAM analysis for yield enhancement

With the explosive growth of battery-operated portable devices, the demand for low power and small size has been increasing for system-on-a-chip (SoC). The FinFET is considered as one of the most promising technologies for future low-power mobile applications because of its good scaling ability, high on-current, better SCE and subthreshold slope, and small leakage current [1]. As a key approach for low-power, supply-voltage (VDD) scaling has been widely used in SoC design. However, SRAM is the limiting factor of voltage-scaling, since all SRAM functions of read, write, and hold-stability are highly influenced by increased variations at low VDD, resulting in lower yield. In addition, the width-quantization property of FinFET device reduces the design window for transistor sizing, and increases the failure probability due to the un-optimized bitcell sizing [1]. In order to overcome the bitcell challenges to high yield, peripheral-assist techniques are required. In this paper, we present 14nm FinFET-based 128Mb 6T SRAM chips featuring low-VMIN with newly developed assist techniques.

A 10 nm FinFET 128 Mb SRAM With Assist Adjustment System for Power, Performance, and Area Optimization

Stereoscopic display technologies have been developed as one of advanced displays, and many TV industrials have been trying commercialization of 3D TV. We have been developing 3D TV based on LCD with LED BLU (backlight unit) since Samsung launched the worlds first 3D TV based on PDP. However, the data scanning of panel and LCs response characteristics of LCD TV cause interference among frames (that is crosstalk), and this makes 3D video quality worse. We propose the method to reduce crosstalk by LCD driving and backlight control of FHD 3D LCD TV.

13.2 A 14nm FinFET 128Mb 6T SRAM with V MIN -enhancement techniques for low-power applications

Conventional patterning techniques, such as self-aligned double patterning (SADP) and litho-etch-litho-etch (LELE), have paved the way for the extreme ultraviolet (EUV) technology that aims to reduce the photomask steps [1,2]. EUV adds the extreme scaling to the high-performance of FinFET technology, thus opening up new opportunities for system-on-chip designers: delivering power, performance, and area (PPA) competitiveness. In terms of area, peripheral logic has scaled down aggressively in comparison to the bitcell given the intense design-rule shrinkage. Figure 12.2.1 shows the bitcell scaling trend and the peripheral logic unit area across different process nodes. Compared to the 10nm process node, the peripheral logic unit area is closer to the bitcell area in a 7nm process node aided by EUV, which allows bi-directional metal lines for scaling. Complex patterns and intensive scaling induce defective elements in the SRAM peripheral logic. Therefore, the probability of yield-loss due to defects is high, which necessitates the need for a repair scheme for the peripheral logic in addition to the SRAM bitcell. Despite the varied literature on bitcell repair, such as the built-in self-repair that analyzes the faulty bitcells to allocate the repair efficiently for a higher repairable rate [3], literature that discusses peripheral logic repair is sparse. Early literature [4] discusses the usage of a sense-amplifier, designed with redundancy, to address the sense-amplifier offset. Nevertheless, it is not related to the peripheral logic repair for yield improvement. This paper exclusively addresses the peripheral logic repair issue to achieve a higher repairable rate. A separate analysis of SRAM macro defect failures, in the bitcell and peripheral logic, provides a deeper understanding so as to increase the maximum repairable rate under random defect conditions.