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Dive into the research topics where Joonggyu Kim is active.

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Featured researches published by Joonggyu Kim.


Advanced Materials | 2015

A Van Der Waals Homojunction: Ideal p–n Diode Behavior in MoSe2

Youngjo Jin; Dong Hoon Keum; Sung-Jin An; Joonggyu Kim; Hyun Seok Lee; Young Hee Lee

A MoSe2 p-n diode with a van der Waals homojunction is demonstrated by stacking undoped (n-type) and Nb-doped (p-type) semiconducting MoSe2 synthesized by chemical vapor transport for Nb substitutional doping. The p-n diode reveals an ideality factor of ≈1.0 and a high external quantum efficiency (≈52%), which increases in response to light intensity due to the negligible recombination rate at the clean homojunction interface.


Advanced Materials | 2016

Wafer-Scale Single-Crystalline AB-Stacked Bilayer Graphene.

Van Luan Nguyen; David J. Perello; Seunghun Lee; Chang Tai Nai; Bong Gyu Shin; Joonggyu Kim; Ho Yeol Park; Hu Young Jeong; Jiong Zhao; Quoc An Vu; Sang Hyub Lee; Kian Ping Loh; Se-Young Jeong; Young Hee Lee

Single-crystalline artificial AB-stacked bilayer graphene is formed by aligned transfer of two single-crystalline monolayers on a wafer-scale. The obtained bilayer has a well-defined interface and is electronically equivalent to exfoliated or direct-grown AB-stacked bilayers.


ACS Nano | 2016

Large-Scale Graphene on Hexagonal-BN Hall Elements: Prediction of Sensor Performance without Magnetic Field.

Min-Kyu Joo; Joonggyu Kim; Ji-Hoon Park; Van Luan Nguyen; Ki Kang Kim; Young Hee Lee; Dongseok Suh

A graphene Hall element (GHE) is an optimal system for a magnetic sensor because of its perfect two-dimensional (2-D) structure, high carrier mobility, and widely tunable carrier concentration. Even though several proof-of-concept devices have been proposed, manufacturing them by mechanical exfoliation of 2-D material or electron-beam lithography is of limited feasibility. Here, we demonstrate a high quality GHE array having a graphene on hexagonal-BN (h-BN) heterostructure, fabricated by photolithography and large-area 2-D materials grown by chemical vapor deposition techniques. A superior performance of GHE was achieved with the help of a bottom h-BN layer, and showed a maximum current-normalized sensitivity of 1986 V/AT, a minimum magnetic resolution of 0.5 mG/Hz(0.5) at f = 300 Hz, and an effective dynamic range larger than 74 dB. Furthermore, on the basis of a thorough understanding of the shift of charge neutrality point depending on various parameters, an analytical model that predicts the magnetic sensor operation of a GHE from its transconductance data without magnetic field is proposed, simplifying the evaluation of each GHE design. These results demonstrate the feasibility of this highly performing graphene device using large-scale manufacturing-friendly fabrication methods.


Nanotechnology | 2003

Nanofabrication of a sub-wavelength size aperture using anisotropic inductively coupled plasma processing

S.S. Choi; M.Y. Jung; Dae-Wook Kim; Joonggyu Kim; Jin-Hyo Boo; J.S. Yang

We successfully fabricated a nano-size silicon oxide aperture using inductively coupled plasma (ICP) anisotropic etching as a potential near-field optical probe application. Several other anisotropic semiconductor processes were also utilized for sub-wavelength size aperture fabrication. Initially, a 2 μm size dot array was photolithographically patterned on an Si(100) wafer. After the formation of a hollow pyramid by anisotropic KOH etching, stress-dependent oxide growth was performed at 1000°C to give an oxide etch-mask for dry etching. Reactive ion etching by 100 W, 9 mTorr, 40 sccm Cl2 feed gas using the ICP system with a negatively biased substrate was performed in order to fabricate the nano-size aperture. After etching at the bias voltages of 500 and 540 V, the diameter of the aperture was measured to be ~ 120 and ~ 200 nm, respectively. Finally, the oxide aperture with a sub-wavelength size diameter was obtained after Si bulk micromachining.


Nanotechnology | 2015

Quantum Hall conductance of graphene combined with charge-trap memory operation.

Haeyong Kang; Yoojoo Yun; Jeongmin Park; Joonggyu Kim; Thuy Kieu Truong; Nahee Park; Hoyeol Yun; Sangwook Lee; Young Hee Lee; Dongseok Suh

The combination of quantum Hall conductance and charge-trap memory operation was qualitatively examined using a graphene field-effect transistor. The characteristics of two terminal quantum Hall conductance appeared clearly on the background of a huge conductance hysteresis during a gate-voltage sweep for a device using monolayer graphene as a channel,hexagonal boron-nitride flakes as a tunneling dielectric and defective silicon oxide as the charge storage node. Even though there was a giant shift of the charge neutrality point, the deviation of quantized resistance value at the state of filling factor 2 was less than 1.6% from half of the von Klitzing constant. At high Landau level indices, the behaviors of quantum conductance oscillation between the increasing and the decreasing electron densities were identical in spite ofa huge memory window exceeding 100 V. Our results indicate that the two physical phenomena, two-terminal quantum Hall conductance and charge-trap memory operation, can be integrated into one device without affecting each other.


Thin Solid Films | 2004

Deposition of epitaxial silicon carbide films using high vacuum MOCVD method for MEMS applications

D.-C. Lim; H.-G. Jee; Joonggyu Kim; J.-S. Moon; S.-B. Lee; S.S. Choi; J.-H. Boo


Current Applied Physics | 2015

Dual-gated BN-sandwiched multilayer graphene field-effect transistor fabricated by stamping transfer method and self-aligned contact

Jeongmin Park; Haeyong Kang; Dongsub Chung; Joonggyu Kim; Yoojoo Yun; Young Hee Lee; Dongseok Suh


Materials Science and Engineering B-advanced Functional Solid-state Materials | 2008

Fabrication of near-field optical probes using advanced functional thin films for MEMS and NEMS applications

J.-S. Hyun; J.S. Moon; J.H. Park; Joonggyu Kim; Young Dok Kim; J.-H. Boo


Thin Solid Films | 2005

The effect of SiCl4 additive gas on the Cl-based Al plasma etch procedure

Dae-Wook Kim; M.Y. Jung; Seong Soo Choi; Joonggyu Kim; J.-H. Boo


Microelectronic Engineering | 2004

Analysis of the aperture formation mechanism in the fabrication process of nano-aperture arrays

Dae-Wook Kim; J.T. Ok; S.S. Choi; C.K. Chun; Joonggyu Kim; Jin-Hyo Boo

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Dongseok Suh

Sungkyunkwan University

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Haeyong Kang

Sungkyunkwan University

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J.-H. Boo

Sungkyunkwan University

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Yoojoo Yun

Sungkyunkwan University

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Yourack Lee

Sungkyunkwan University

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Min-Kyu Joo

Sungkyunkwan University

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