Junzo Azuma | Researchain

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Featured researches published by Junzo Azuma.

Archive | 2001

Probe driving method, and probe apparatus

Satoshi Tomimatsu; Hidemi Koike; Junzo Azuma; Tohru Ishitani; Aritoshi Sugimoto; Yuichi Hamamura; Isamu Sekihara; Akira Shimase

Archive | 2004

Apparatus for inspecting defects of devices and method of inspecting defects

Tohru Ishitani; Hidemi Koike; Aritoshi Sugimoto; Isamu Sekihara; Kaoru Umemura; Satoshi Tomimatsu; Junzo Azuma

Archive | 2000

Apparatus for detecting defect in device and method of detecting defect

Tohru Ishitani; Hidemi Koike; Aritoshi Sugimoto; Isamu Sekihara; Kaoru Umemura; Satoshi Tomimatsu; Junzo Azuma

Archive | 1994

PROCESSING METHOD AND DEVICE USING FOCUSED ION BEAM GENERATING MEANS

Junzo Azuma; Yuichi Hamamura; Fumikazu Ito; Takashi Kamimura; Yoshimi Kawanami; Yuichi Madokoro; Michinobu Mizumura; Akira Shimase; Kaoru Umemura; 隆上村; 文和伊藤; 朗嶋瀬; 義実川浪; 淳三東; 馨梅村; 通伸水村; 有一濱村; 祐一間所

Archive | 1996

METHOD AND EQUIPMENT FOR INSPECTING SEMICONDUCTOR DEVICE

Junzo Azuma; Takashi Hiroi; Fumikazu Ito; Tomohiro Kuni; Kaoru Oogaya; Akira Shimase; Maki Tanaka; Masahiro Watanabe; 朝宏久邇; 文和伊藤; 薫大鋸谷; 朗嶋瀬; 高志広井; 淳三東; 正浩渡辺; 麻紀田中

Archive | 2000

Probe driving method and probe device

Junzo Azuma; Yuichi Hamamura; Toru Ishitani; Hidemi Koike; Takeshi Sekihara; Akira Shimase; Aritoshi Sugimoto; Satoshi Tomimatsu; 聡富松; 英巳小池; 朗嶋瀬; 有俊杉本; 淳三東; 有一濱村; 亨石谷; 雄関原

Archive | 1998

Standard sample for calibration of optical inspection apparatus, its manufacture and method for calibrating sensitivity of the apparatus

Junzo Azuma; Shunichi Matsumoto; Akira Shimase; Mitsuko Shinada; Hiroaki Shishido; 美津子品田; 弘明宍戸; 朗嶋瀬; 淳三東; 俊一松本

Archive | 2010

Charged Particle Radiation Apparatus, and Method for Displaying Three-Dimensional Information in Charged Particle Radiation Apparatus

Toshie Yaguchi; Yasuhira Nagakubo; Junzo Azuma; Akira Watabe

Archive | 2007

Specified position identifying method and specified position measuring apparatus

Ruriko Tsuneta; Tohru Ando; Junzo Azuma

Archive | 1999

Device and method for treating charge beam and failure analysis method of semiconductor and/or in-vacuum evaluation device of sample

Junzo Azuma; Yuichi Hamamura; Hidemi Koike; Michinobu Mizumura; Norimasa Nishimura; Akira Shimase; Yasuo Sonobe; 泰夫園部; 英巳小池; 朗嶋瀬; 淳三東; 通伸水村; 有一濱村; 規正西村

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