Kazuhiro Oyama
Hitachi
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Publication
Featured researches published by Kazuhiro Oyama.
IEEE Transactions on Electron Devices | 2007
Mutsuhiro Mori; Kazuhiro Oyama; Yasuhiko Kohno; Junichi Sakano; Junpei Uruno; Katsuo Ishizaka; Daisuke Kawase
This paper describes a new 600-V trench-gate high-conductivity insulated gate bipolar transistor (trench HiGT) that has both a low collector-emitter saturation voltage of 1.55 V at 200 and a tough short-circuit capability of more than 10 . The trench HiGT also has better tradeoff relationship between turn-off switching loss and collector-emitter saturation voltage compared to either an insulated gate bipolar transistor (IGBT) with a planar gate or a conventional trench gate. A reverse transfer capacitance that is 50% lower than that of the planar-gate IGBT and an input capacitance that is 40% lower than that of a conventional trench gate IGBT have been obtained for the trench HiGT.
IEEE Transactions on Electron Devices | 2007
Mutsuhiro Mori; Kazuhiro Oyama; Taiga Arai; Junichi Sakano; Yoshitaka Nishimura; Koutarou Masuda; Katsuaki Saito; Yoshihiro Uchino; Hideo Homma
A high-conductivity insulated gate bipolar transistor (IGBT) (HiGT) with a double diffused MOS structure and an n-type hole-barrier layer surrounding a p-layer (planar HiGT) is presented. The hole-barrier layer prevents the holes from flowing into the p-layer and stores them in the n-layer. The planar HiGT provides a better tradeoff between collector-emitter saturation voltage [VcE(sat)] and turn-off loss than conventional IGBTs, regardless of the injection efficiency of the p-layer on the collector side, while it maintains a high blocking voltage by controlling the sheet carrier concentration of the hole-barrier layer. The planar HiGT has a tough short-circuit capability of more than 10 mus at 125degC, with a saturation current similar to that of conventional IGBTs.
international symposium on power semiconductor devices and ic s | 2001
Kazuhiro Oyama; Y. Kohno; Junichi Sakano; J. Uruno; K. Ishizaka; Daisuke Kawase; Mutsuhiro Mori
This paper describes new 600-V trench high-conductivity IGBTs (trench HiGTs) that have lower on-state voltages of 1.42 and 1.55 V at 200 A/cm/sup 2/ and tough short-circuit capabilities of 5 and 10 /spl mu/s, respectively. These HiGT have a better trade-off between turn-off losses and on-state voltages than conventional trench IGBTs, even better than planar IGBTs. They also offer a lower reverse transfer capacitances (-50%) than the planar IGBT. The input capacitance obtained were lower (-30% to -60%) than that of a conventional trench IGBT.
Archive | 2007
Kazuhiro Oyama; Mutsuhiro Mori; Katsuaki Saito; Yoshihiko Koike
Archive | 2008
Kazuhiro Oyama; Ryu Gemba
Archive | 2008
Naoki Haramai; Hiroshi Yokouchi; Ryu Gemba; Atsushi Kondo; Kazuhiro Oyama
Archive | 2012
Kazuhiro Oyama; Hiroshi Yokouchi
Archive | 2006
Taiga Arai; Mutsuhiro Mori; Kazuhiro Oyama; Yasuhiko Kohno; Naoki Sakurai
Archive | 2000
Mutsuhiro Mori; Kazuhiro Oyama; Jyunichi Sakano
Archive | 2000
Mutsuhiro Mori; Kazuhiro Oyama; Jyunichi Sakano