Kiyoshi Takekoshi

Moving table apparatus

Inspection stage including a plurality of Z shafts, and inspection apparatus

Probe card with pyramid shaped thin film contacts

Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method

LCD testing apparatus

Apparatus for examining target objects such as LCD panels

Dicing method, method of inspecting integrated circuit element, substrate holding device, and pressure sensitive adhesive film

Probe with trapezoidal contactor and device based on application thereof, and method of producing them

Inspection method and inspection apparatus

Probe arrangement assembly, method of manufacturing probe arrangement assembly, probe mounting method using probe arrangement assembly, and probe mounting apparatus