Koichi Kawai

Nonvolatile semiconductor memory and its test method

Semiconductor memory device and electric device with the same

Nonvolatile memory cell having current compensated for temperature dependency and data read method thereof

Semiconductor integrated circuit adapted to output pass/fail results of internal operations

Semiconductor memory device and method of controlling write sequence thereof

Non-volatile semiconductor memory device and electric device with the same

Semiconductor storage device having page copying

Semiconductor device, nonvolatile semiconductor memory, system including a plurality of semiconductor devices or nonvolatile semiconductor memories, electric card including semiconductor device or nonvolatile semiconductor memory, and electric device with which this electric card can be used

Non-volatile semiconductor memory device in which one page is set for a plurality of memory cell arrays

Method of programming non-volatile semiconductor memory device having an electrically erasable and programmable memory cell array