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Dive into the research topics where Koichiro Yuki is active.

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Featured researches published by Koichiro Yuki.


Japanese Journal of Applied Physics | 1995

Fabrication of Novel Si Double-Barrier Structures and Their Characteristics

Koichiro Yuki; Yoshihiko Hirai; Kiyoshi Morimoto; Kaoru Inoue; Masaaki Niwa; Juro Yasui

A novel Si (silicon)-based double-barrier structure (DBS) is newly proposed to study Si resonant tunneling devices. To form a thin Si single-crystal plate as a quantum well, anisotropic wet chemical etching and thermal oxidation are adopted. The DBS has a 43 nm-wide Si quantum well and 2.3 nm-thick SiO 2 barriers. The electrical characteristic exhibits negative differential conductance (NDC)


Japanese Journal of Applied Physics | 2001

Bandgap and Strain Engineering in SiGeC Heterojunction Bipolar Transistors

Koichiro Yuki; Kenji Toyoda; Takeshi Takagi; Yoshihiko Kanzawa; Katsuya Nozawa; Toru Saitoh; Minoru Kubo

The incorporation of C into Si1-xGex alloys contributes to enlarging the critical layer thickness and to improving the thermal budget. It also realizes a narrower bandgap with compensated strain. These effects would introduce good performance at high frequency in the devices. We fabricate heterojunction bipolar transistors (HBTs) with an Si1-x-yGexCy base layer using ultrahigh-vacuum chemical vapor deposition (UHV-CVD) technology. The bandgaps of Si1-x-yGexCy base layers are measured by the evaluation of the collector current dependence on temperature. The strain of the pseudomorphic Si1-x-yGexCy layer is also extracted by an analysis of the X-ray diffraction spectra. Good flexibility of Si1-x-yGexCy alloy is shown for the bandgap and strain engineering. The devices using the excellent characteristics of Si1-x-yGexCy alloy have numerous applications for wireless telecommunications.


bipolar/bicmos circuits and technology meeting | 2000

Reduction of neutral base recombination in narrow band-gap SiGeC base heterojunction bipolar transistors

T. Takagi; Koichiro Yuki; Kenji Toyoda; Yoshihiko Kanzawa; Koji Katayama; Katsuya Nozawa; Tohru Saitoh; M. Kubo

Narrow band-gap SiGeC base HBTs were fabricated by Si compatible processing. By introducing 0.3% carbon into the SiGe layers, lattice strain was decreased and neutral base recombination localized at the collector-base heterojunction was significantly reduced.


The Japan Society of Applied Physics | 1995

Fabrication and Transport Properties of Gate-All-Around Silicon Quantum Wire Transistor

K. Morimoto; Yoshihiko Hirai; Koichiro Yuki; K. Morita

A novel fabrication method of silicon quantum wire Gate-All-Around Iransistor (GAAT), in which the gate oxide and the gate electrode are wrapped around the ultra fine silicon quantum wire, has been proposed. In order to verify one-dimensional (1D) subbands effects, we have studied quantum transport in Si quantum wire GAAT with a width of 50nm at low temperatures in zero-magnetic field and in fields up to 10T. Electrical population of lD subbands and magnetic depopulation of lD subbands are clearly observed.


Japanese Journal of Applied Physics | 2004

Base Current Control in Low-VBE-Operated SiGeC Heterojunction Bipolar Transistors Using SiGe-Cap Structure and High-Carbon-Content Base

Tohru Saitoh; Takahiro Kawashima; Yoshihiko Kanzawa; Junko Sato-Iwanaga; Ken Idota; Takeshi Takagi; Teruhito Ohnishi; Koichiro Yuki; Tsuneichiro Sano; Shigeki Sawada

We have demonstrated the low-VBE operation of SiGeC heterojunction bipolar transistors by introducing a novel device design concept using the SiGe cap structure and high Ge- (up to 25%) and C- (up to 0.8%) content base. We successfully controlled the base current by designing the SiGe cap structure and C content, which enabled us to obtain suitable values of hFE and BVCEO, while maintaining a high collector current and high-frequency performance. We clarified that the recombination around the emitter-base junction is enhanced by introducing the SiGe cap structure and high C content, which contribute to the increase of the base current.


Archive | 2000

Heterojunction bipolar transistor and method for fabricating the same

Takeshi Takagi; Koichiro Yuki; Kenji Toyoda; Yoshihiko Kanzawa


Archive | 1995

Quantization functional device utilizing a resonance tunneling effect and method for producing the same

Koichiro Yuki; Yoshihiko Hirai; Kiyoshi Morimoto; Masaaki Niwa; Juro Yasui; Kenji Okada; Masaharu Udagawa; Kiyoyuki Morita


Archive | 1997

MIS SOI semiconductor device with RTD and/or HET

Kiyoyuki Morita; Kiyoshi Morimoto; Koichiro Yuki; Kiyoshi Araki


Archive | 1998

Resonance tunnel device

Koichiro Yuki; Kiyoyuki Morita; Kiyoshi Morimoto; Yoshihiko Hirai


Archive | 2006

Bipolar transistor and method for fabricating the same

Teruhito Ohnishi; Koichiro Yuki; Tsuneichiro Sano; Tohru Saitoh; Ken Idota; Takahiro Kawashima; Shigeki Sawada

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Takeshi Takagi

Tokyo Institute of Technology

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