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IEEE Transactions on Components, Hybrids, and Manufacturing Technology | 1990

Silicone die bond adhesive and clean in-line cure for copper lead frame

Kazunari Suzuki; Tomoko Higashino; Kunihiro Tsubosaki; Akira Kabashima; Katsutoshi Mine; Kazumi Nakayoshi

Stress analysis by the finite-element method and a die bonding experiment were performed indicating that a die bond adhesive having a very low Youngs modulus is effective in reducing thermal stress. A silicone elastomer adhesive and an in-line cure process named the clean cure process were developed. In this process, the adhesive is cured quickly on a heat column, thus volatile organic species which affect the yield and reliability of devices are reduced significantly during cure. The bonding of large silicon dice to copper lead frames was successfully performed using this technology. >


Quarterly Journal of The Japan Welding Society | 1998

Development of Coated-Wire Bonding Technology.

Tsuyoshi Kaneda; Hiroshi Watanabe; Yukiharu Akiyama; Kunihiro Tsubosaki; Asao Nishimura; Kunihiko Nishi

Wire bonding technology is being applied to narrower pad piches and longer spans in LSI packages with the increase in number of input-output pins and shrinkage in chip size. This makes adjoining wires liable to touch during the molding process. To solve fundamentally this problem, the authors have been developing bonding technologies, using coated gold wires which do not suffer from short circuit failures even if the wire touch occurs.In this study, various coated wires were evaluated to select the optimum coating film with improved resistance to the wire touch at high tempratures and improved bonding continuity. Packages were then assembled with the selected wires, and various reliability tests were conducted.The best properties were obtained with the coating film of 0.4 μm thick heat-resistant formal, which showed high insulation reliability in a high temperature wire-crossing test and enabled continual bonding for more than one hundred thousand wire connections. It was confirmed that the assembled packages have sufficient insulation reliability between touching wires and that no failures occurred in various reliability tests including temperature cycling and high temperature high humidity bias tests.


Archive | 1996

Plastic molded type semiconductor device and fabrication process thereof

Yoshinori Miyaki; Hiromichi Suzuki; Kazunari Suzuki; Takafumi Nishita; Fujio Ito; Kunihiro Tsubosaki; Akihiko Kameoka; Kunihiko Nishi


Archive | 2001

Methods of processing semiconductor wafer, and producing IC card, and carrier

Toshio Miyamoto; Kunihiro Tsubosaki; Mitsuo Usami


Archive | 1999

Semiconductor device and method for making same

Mitsuo Usami; Kunihiro Tsubosaki; Kunihiko Nishi


Archive | 1992

Semiconductor device with lead structure within the planar area of the device

Kunihiro Tsubosaki; Michio Tanimoto; Kunihiko Nishi; Masahiro Ichitani; Shunji Koike; Kazunari Suzuki; Ryosuke Kimoto; Ichiro Anjoh; Taisei Jin; Akihiko Iwaya; Gen Murakami; Masamichi Ishihara; Junichi Arita


Archive | 2003

Circuit tape having adhesive film, semiconductor device, and a method for manufacturing the same

Akira Nagai; Shuji Eguchi; Masahiko Ogino; Masanori Segawa; Toshiak Ishii; Nobutake Tsuyuno; Hiroyoshi Kokaku; Rie Hattori; Makoto Morishima; Ichiro Anjoh; Kunihiro Tsubosaki; Chuichi Miyazaki; Makoto Kitano; Mamoru Mita; Norio Okabe


Archive | 2002

Semiconductor package and flip chip bonding method therein

Ryoichi Kajiwara; Masahiro Koizumi; Toshiaki Morita; Kazuya Takahashi; Asao Nishimura; Kunihiro Tsubosaki


Archive | 1997

Lead frame having a supporting pad with a plurality of slits arranged to permit the flow of resin so as to prevent the occurrence of voids

Kazuhiro Terada; Kunihiro Tsubosaki; Hiroshi Watanabe; Kazunari Suzuki


Archive | 1993

Ultrasonic bonding apparatus and quality monitoring method

Ryoichi Kajiwara; Mituo Katou; Kazuya Takahashi; Minoru Maruta; Tokiyuki Seto; Kunihiro Tsubosaki

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