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Publication


Featured researches published by Lambert Danner.


Proceedings of SPIE, the International Society for Optical Engineering | 2006

Ultra High Performance Microscope Objectives: The State of the Art in Design, Manufacturing and Testing

Thomas Sure; Lambert Danner; Peter Euteneuer; Gerhard Hoppen; Armin Pausch; Wolfgang Vollrath

During the last years, new microscope applications require an increased resolution which enforces the development of new state of the art high NA immersion objectives. With the introduction of the 4Pi confocal fluorescence microscope, the increase of the numerical aperture from NA=1.4 to NA=1.46 makes sense, although the gain of lateral resolution is quite small. On the other hand, for inspection and metrology in the semiconductor industry the continuously decreasing structures need the highest possible resolution, which can be achieved with high NA water immersion objectives working in the DUV wavelength range. Building this kind of objectives requires special measuring and testing technologies and a manufacturing precision which has never been realized before in series production.


Archive | 2001

Optical measurement arrangement having an ellipsometer

Hakon Mikkelsen; Horst Engel; Lambert Danner; Christof Stey


Archive | 2003

Device and method for inspecting an object

Franz Dr. Cemic; Lambert Danner; Uwe Graf; Robert Mainberger; Dirk Sönksen; Volker Knorz


Archive | 2001

Spectral ellipsometer having a refractive illuminating optical system

Lambert Danner; Joachim Wienecke


Archive | 2005

Measuring instrument and method for operating a measuring instrument for optical inspection of an object

Klaus Rinn; Lambert Danner


Archive | 2005

Apparatus and Method for Inspecting Microstructures in Reflected or Transmitted Infrared Light

Uwe Graf; Lambert Danner


Archive | 2001

Illumination device; and coordinate measuring instrument having an illumination device

Franz Dr. Cemic; Lambert Danner; Gerhard Hoppen


Archive | 2003

Autofocus module and method for a microscope-based system

Franz Dr. Cemic; Lambert Danner; Robert Mainberger; Michael Veith; Martin Osterfeld; Uwe Graf


Archive | 2003

Vorrichtung und Verfahren zur Inspektion eines Objekts

Franz Dr. Cemic; Lambert Danner; Uwe Graf; Volker Knorz; Robert Mainberger; Dirk Sönksen


Archive | 2000

Illumination device for a DUV microscope and DUV microscope

Lambert Danner; Frank Eisenkrämer; Michael Veith; Wolfgang Vollrath; Martin Osterfeld

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