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Dive into the research topics where Louis Bernard Bushard is active.

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Featured researches published by Louis Bernard Bushard.


asian test symposium | 2006

DFT of the Cell Processor and its Impact on EDA Test Softwar

Louis Bernard Bushard; Nathan P Chelstrom; Steven Ross Ferguson; Brion L. Keller

This paper describes aspects of the Cell processor DFT and its effects on the EDA software used to process it. The Cell processor is a very complex multi-core design, and the use of high frequency clocks near 4 GHz drove DFT decisions that had significant implications on several levels. The processor had to support Logic BIST, Memory BIST, OPMSR+, SerDes I/O-WRAP as well as traditional scan-based ATPG all using a free-running high-speed clock


Archive | 2008

LSSD compatibility for GSD unified global clock buffers

James D. Warnock; Wendel Dieter; David E. Lackey; William V. Huott; Leon J. Sigal; Louis Bernard Bushard; Sang Hoo Dhong


Archive | 2008

Method and apparatus for testing a ring of non-scan latches with logic built-in self-test

Louis Bernard Bushard; Nathan P. Chelstrom; Naoki Kiryu; David John Krolak


Archive | 2009

APPARATUS FOR IMPLEMENTING EFUSE SENSE AMPLIFIER TESTING WITHOUT BLOWING THE EFUSE

Anthony Gus Aipperspach; David Howard Allen; Louis Bernard Bushard; Phil C. Paone; Gregory J. Uhlmann


Archive | 2004

Memory array manufacturing defect detection system and method

Louis Bernard Bushard; Sang Hoo Dhong; Brian Flachs; Osamu Takahashi; Michael Brian White


Archive | 2007

Method for implementing eFuse sense amplifier testing without blowing the eFuse

Anthony Gus Aipperspach; David Howard Allen; Louis Bernard Bushard; Phil C. Paone; Gregory J. Uhlmann


Archive | 2007

Staggered LBIST Clock Sequence for Noise (di/dt) Amelioration

Anthony Gus Aipperspach; Louis Bernard Bushard; Dennis Thomas Cox


Archive | 2005

Signal pin tester for AC defects in integrated circuits

Frank W. Angelotti; Louis Bernard Bushard; Matthew S. Grady; Scott A. Strissel


Archive | 2007

Implementing Efuse sense amplifier testing without blowing the Efuse

Anthony Gus Aipperspach; David Howard Allen; Louis Bernard Bushard; Phil C. Paone; Gregory J. Uhlmann


Archive | 2004

Methods and apparatus for testing a memory

Anthony Gus Aipperspach; Louis Bernard Bushard; Akihiko Fukui; Garrett Stephen Koch

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