Ludwik Spiralski

Uncertainty In Measuring Noise Parameters Of a Communication Receiver

The paper presents the method of assessing uncertainty in measuring the usable sensitivity Es of communication receiver. The influence of partial uncertainties of measuring the noise factor F and the energy pass band of the receiver Δf on the combined standard uncertainty level is analyzed. The method to assess the uncertainty in measuring the noise factor on the basis of the systematic component of uncertainty, assuming that the main source of measurement uncertainty is the hardware of the measuring system, is proposed. The assessment of uncertainty in measuring the pass band of the receiver is determined with the assumption that input quantities of the measurement equation are not correlated. They are successive, discrete values of the spectral power density of the noise on the output of receiver. The results of the analyses of particular uncertainties components of measuring the sensitivity, which were carried out for a typical communication receiver, are presented.

Method of noise figure measurement with elimination of losses of input matching circuit

The main sources of instrumentation errors (inaccuracy of source admittance setting, inherent noise of measuring system, losses of input matching circuit) occurring at the noise figure measurement have been analyzed. They have great influence on the accuracy of estimation of noise parameter set of linear twoports. Selected results obtained by means of the elaborated system for the noise figure measurement are presented. The system was applied for the measurement of noise properties of two‐gates MOSFETs at the frequency f=200 MHz.

A Method Of Two‐Terminal Excess Noise Measurement With A Reduction Of Measurement System And Contact Noise

The method and the system for excess noise measurement of electrical two‐terminal components with the significant reduction of the system and contact noise influence is presented. The proposed method can be applied for noise measurements either on devices with terminals or on the wafer level, where as a reference noise the noise of resistive structure fabricated directly on the wafer in the vicinity of the tested component can be used.

Foil Capacitors Reliability Prediction Based On Fluctuation And Non‐Linear Phenomena

Non‐linearity and noise properties of a capacitor have been analysed to established criteria for selection of interference suppressor capacitors for different endurance (sustainability) and reliability groups. It can improve the process of quality estimation of high reliability capacitors. Selected experimental results of measurements for capacitors produced by MIFLEX (Poland) have been presented. The implementation of techniques for non‐linearity and noise measurements in the system for production testing of high reliability interference suppressor capacitors is described.