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Dive into the research topics where Marc Tobias Wenzel is active.

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Featured researches published by Marc Tobias Wenzel.


Nano Letters | 2008

Distance Dependent Spectral Tuning of Two Coupled Metal Nanoparticles

Phillip Olk; Jan Renger; Marc Tobias Wenzel; Lukas M. Eng

The spectral properties of two spherical metallic nanoparticles of 80 nm in diameter are examined with regard to the interparticle distance and relative polarization of the excitation light. One Au nanoparticle is attached to a scanning fiber probe and the second to a scanning substrate. This configuration allows three-dimensional and arbitrary manipulation of both distance and relative orientation with respect to the incident light polarization. As supported by numerical simulations, a periodic modulation of the coupled plasmon resonance is observed for separations smaller than 1.5 microm. This interparticle coupling affects the scattering cross section in terms of spectral position and spectral width as well as the integral intensity of the Mie-scattered light.


Optics Express | 2008

Optically controlled interparticle distance tuning and welding of single gold nanoparticle pairs by photochemical metal deposition

Thomas Härtling; Yury Alaverdyan; Andreas Hille; Marc Tobias Wenzel; Mikael Käll; Lukas M. Eng

We report on the in-situ controlled tuning of the particle gap in single pairs of gold nanodisks by photochemical metal deposition. The optically induced growth of nanodisk dimers fabricated by electron beam lithography leads to a decrease of the interparticle gap width down to 0 nm. Due to the increasing particle size and stronger plasmonic coupling, a smooth redshift of the localized surface plasmon (LSP) resonances is observed in such particle pairs during the growth process. The interparticle gap width, and hence the LSP resonance, can be tuned to any desired spectral position. The experimental results we obtain with this nanoscale fabrication technique are well described by the so-called plasmon ruler equation. Consequently, both the changes in particle diameter as well as in gap width can be characterized in-situ via far-field read-out of the optical properties of the dimers.


Nano Letters | 2012

Intersublevel Spectroscopy on Single InAs-Quantum Dots by Terahertz Near-Field Microscopy

Rainer Jacob; Stephan Winnerl; Markus Fehrenbacher; J. Bhattacharyya; Harald Schneider; Marc Tobias Wenzel; Hans-Georg von Ribbeck; Lukas M. Eng; Paola Atkinson; Oliver G. Schmidt; Manfred Helm

Using scattering-type near-field infrared microscopy in combination with a free-electron laser, intersublevel transitions in buried single InAs quantum dots are investigated. The experiments are performed at room temperature on doped self-assembled quantum dots capped with a 70 nm GaAs layer. Clear near-field contrast of single dots is observed when the photon energy of the incident beam matches intersublevel transition energies, namely the p-d and s-d transition of conduction band electrons confined in the dots. The observed room-temperature line width of 5-8 meV of these resonances in the mid-infrared range is significantly below the inhomogeneously broadened spectral lines of quantum dot ensembles. The experiment highlights the strength of near-field microspectroscopy by demonstrating signals from bound-to-bound transitions of single electrons in a probe volume of the order of (100 nm)(3).


Optical Materials Express | 2011

Microspectroscopy on perovskite-based superlenses [Invited]

Susanne C. Kehr; Pu Yu; Yongmin Liu; Markus Parzefall; Asif Islam Khan; Rainer Jacob; Marc Tobias Wenzel; Hans-Georg von Ribbeck; Manfred Helm; Xiang Zhang; Lukas M. Eng; R. Ramesh

Superlenses create sub-diffraction-limit images by reconstructing the evanescent fields arising from an object. We study the lateral, vertical, and spectral field distribution of three different perovskite-based superlenses by means of scattering-type near-field microscopy. Sub-diffraction-limit resolution is observed for all samples with an image contrast depending on losses such as scattering and absorption. For the three lenses superlensing is observed at slightly different frequencies resulting in an overall broad frequency range of 3.6 THz around 20 THz.


Optics Express | 2010

Quantitative determination of the charge carrier concentration of ion implanted silicon by IR-near-field spectroscopy.

Rainer Jacob; Stephan Winnerl; Harald Schneider; Manfred Helm; Marc Tobias Wenzel; Hans-Georg von Ribbeck; Lukas M. Eng; Susanne C. Kehr

We use a combination of a scattering-type near-field infrared microscope with a free-electron laser as an intense, tunable radiation source to spatially and spectrally resolve buried doped layers in silicon. To this end, boron implanted stripes in silicon are raster scanned at different wavelengths in the range from 10 to 14 µm. An analysis based on a simple Drude model for the dielectric function of the sample yields quantitatively correct values for the concentration of the activated carriers. In a control experiment at the fixed wavelength of 10.6 µm, interferometric near-field signals are recorded. The phase information gained in this experiment is fully consistent with the carrier concentration obtained in the spectrally resolved experiments.


Optics Express | 2008

Gold nanoparticle tips for optical field confinement in infrared scattering near-field optical microscopy

Marc Tobias Wenzel; Thomas Härtling; Phillip Olk; Susanne C. Kehr; Stefan Grafström; Stephan Winnerl; Manfred Helm; Lukas M. Eng

We report on the implementation of metal nanoparticles as probes for scattering and apertureless near-field optical investigations in the mid-infrared (mid-IR) spectral regime. At these wavelengths, an efficient electric-field confinement is necessary and achieved here through a gold metal nanoparticle of 80 nm in diameter (Au80-MNP) acting as the optical antenna. The Au80-MNP is attached to a standard AFM cantilever used as the spatial manipulator. When approached to a sample surface while being illuminated with an infrared beam, the Au80-MNP produces a considerably improved spatial confinement of the electric field compared to an ordinary scattering AFM tip. We demonstrate here the confinement normal to the sample surface by making use of a sample-induced phonon polariton resonance in a ferroelectric lithium niobate sample. Our experimental findings are in very good agreement with the quasistatic dipole model and show improved optical resolution via well-selected antenna particles.


international conference on infrared, millimeter, and terahertz waves | 2010

Scattering near-field microscopy in the THz region using a free-electron laser

Hans-Georg von Ribbeck; Marc Tobias Wenzel; Rainer Jacob; Lukas M. Eng

We present scattering-type scanning near-field optical micro-spectroscopy (s-SNOM) investigations successfully operated in the THz range with a wavelength independent spatial resolution of < 150 nm. As a variable and monochromatic radiation source we use the free-electron laser (FELBE) located at the Forschungszentrum Dresden-Rossendorf (FZD) tunable over the wavelength range from 4–250 μm.


Nano Letters | 2007

Two particle enhanced nano Raman microscopy and spectroscopy.

Phillip Olk; Jan Renger; Thomas Härtling; Marc Tobias Wenzel; Lukas M. Eng


Journal of Physical Chemistry C | 2008

Photochemical Tuning of Plasmon Resonances in Single Gold Nanoparticles

Thomas Härtling; Yury Alaverdyan; Marc Tobias Wenzel; René Kullock; Mikael Käll; Lukas M. Eng


Archive | 2007

Device for production of optically sensitive probes for scanning probe microscopy, has substrate, which is formed transparently, and immersion fluid is placed on substrate and below transparent substrate

Lukas M. Eng; Thomas Härtling; Phillip Olk; Marc Tobias Wenzel

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Lukas M. Eng

Dresden University of Technology

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Phillip Olk

Dresden University of Technology

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Hans-Georg von Ribbeck

Dresden University of Technology

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Manfred Helm

Helmholtz-Zentrum Dresden-Rossendorf

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Rainer Jacob

Helmholtz-Zentrum Dresden-Rossendorf

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Stephan Winnerl

Helmholtz-Zentrum Dresden-Rossendorf

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Susanne C. Kehr

Dresden University of Technology

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Harald Schneider

Helmholtz-Zentrum Dresden-Rossendorf

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