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Dive into the research topics where Marek Zywno is active.

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Featured researches published by Marek Zywno.


Proceedings of SPIE | 2009

REBL nanowriter: Reflective Electron Beam Lithography

Paul Petric; Chris Bevis; Alan D. Brodie; Allen Carroll; Anthony Cheung; Luca Grella; Mark A. McCord; Henry Percy; Keith Standiford; Marek Zywno

REBL (Reflective Electron Beam Lithography) is being developed for high throughput electron beam direct write maskless lithography. The system is specifically targeting 5 to 7 wafer levels per hour throughput on average at the 45 nm node, with extendibility to the 32 nm node and beyond. REBL incorporates a number of novel technologies to generate and expose lithographic patterns at estimated throughputs considerably higher than electron beam lithography has been able to achieve as yet. A patented reflective electron optic concept enables the unique approach utilized for the Digital Pattern Generator (DPG). The DPG is a CMOS ASIC chip with an array of small, independently controllable cells or pixels, which act as an array of electron mirrors. In this way, the system is capable of generating the pattern to be written using massively parallel exposure by ~1 million beams at extremely high data rates (~ 1Tbps). A rotary stage concept using a rotating platen carrying multiple wafers optimizes the writing strategy of the DPG to achieve the capability of high throughput for sparse pattern wafer levels. The exposure method utilized by the DPG was emulated on a Vistec VB-6 in order to validate the gray level exposure method used in REBL. Results of these exposure tests are discussed.


Journal of Vacuum Science & Technology B | 2009

REBL: A novel approach to high speed maskless electron beam direct write lithography

Paul F. Petric; Chris Bevis; Allen M. Carroll; Henry Percy; Marek Zywno; Keith Standiford; Alan D. Brodie; Noah Bareket; Luca Grella

The system concepts used in a novel approach for a high throughput maskless lithography system called reflective electron beam lithography (REBL) are described. The system is specifically targeting five to seven wafer levels per hour throughput on average at the 45nm node, with extendibility to the 32nm node and beyond. REBL incorporates a number of novel technologies to generate and expose lithographic patterns at estimated throughputs considerably higher than electron beam lithography has been able to achieve as yet. A patented reflective electron optic concept enables the unique approach utilized for the digital pattern generator (DPG). The DPG is a complementary metal oxide semiconductor application specific integrated circuit chip with an array of small, independently controllable metallic cells or pixels, which act as an array of electron mirrors. In this way, the system is capable of generating the pattern to be written using massively parallel exposure by ∼1×106 beams at extremely high data rates ...


Archive | 1995

Automated photomask inspection apparatus and method

David Emery; Zain Kahuna Saidin; Mark J. Wihl; Tao-Yi Fu; Marek Zywno; Damon F. Kvamme; Michael E Fein


Archive | 1994

Automated photomask inspection apparatus

Mark J. Wihl; Tao-Yi Fu; Marek Zywno; Damon F. Kvamme; Michael E Fein


Archive | 2008

Dynamic tracking of wafer motion and distortion during lithography

Noah Bareket; Marek Zywno


Archive | 2008

Substrate processing apparatus and method

Marek Zywno; Noah Bareket


Archive | 2013

Z-STAGE WITH DYNAMICALLY DRIVEN STAGE MIRROR AND CHUCK ASSEMBLY

Salam Harb; Kent Douglas; Marek Zywno; James Haslim; Jon Hamilton


Archive | 2012

Heat removal from substrates in vacuum

Marek Zywno; Layton Hale


Archive | 2002

Automatic photomask-inspecting apparatus and method

David Emery; Michael E Fein; Tao-Yi Fu; Damon F. Kvamme; Zain Kahuna Saidin; Mark J. Wihl; Marek Zywno; ザイン・カフナ・サイディン; − イー・フー タオ; デイビッド・ガース・エマリー; デーモン・エフ・クバンム; マーク・ジェイ・ウィル; マーレック・ジウノー; マイケル・イー・フェイン


Archive | 2015

Z-stage with dynamically driven stage mirror and chuck assembly having constraint

Salam Harb; Kent Douglas; Marek Zywno; James Haslim; Jon Hamilton

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