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Martin Perner

Infineon Technologies

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Publication

Featured researches published by Martin Perner.

Archive | 2002

Integrated memory and method for testing and repairing the integrated memory

Martin Perner

Archive | 2005

Semi-conductor component, as well as a process for the in-or output of test data

Thorsten Bucksch; Martin Perner; Volker Kilian; Martin Meier

Archive | 2003

Integrated dynamic memory and operating method

Martin Perner

Archive | 2004

Operating parameters e.g. operating temperatures, reading and selecting method for e.g. dynamic RAM, involves providing memory with registers to store parameters, where read and write access on register takes place similar to access on cell

Thorsten Bucksch; Martin Perner

Archive | 2005

Semiconductor circuit and method for testing, monitoring and application-near setting of a semiconductor circuit

Martin Perner

Archive | 2002

Method and device for determining an operating temperature of a semiconductor component

Martin Perner

Archive | 2006

Electronic memory apparatus and method for operating an electronic memory apparatus

Martin Perner

Archive | 2004

Circuit and method for refreshing memory cells of a dynamic memory

Martin Perner

Archive | 2005

Inputting and outputting operating parameters for an integrated semiconductor memory device

Martin Perner; Thorsten Bucksch

Archive | 2004

Circuit and method for evaluating and controlling a refresh rate of memory cells of a dynamic memory

Martin Perner

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Collaboration

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Volker Kilian

Infineon Technologies

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Thorsten Bucksch

Infineon Technologies

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Dirk Fuhrmann

Infineon Technologies

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Martin Meier

Qimonda

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Martin Versen

Infineon Technologies

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Peter Beer

Infineon Technologies

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Manfred Moser

Infineon Technologies

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