Volker Kilian

Semi-conductor component, as well as a process for the in-or output of test data

Method for generating test signals for an integrated circuit and test logic unit

Method and apparatus for finding a fault in a signal path on a printed circuit board

Loop-back method for measuring the interface timing of semiconductor devices with the aid of signatures and/or parity methods

Memory device and method for testing memory devices with repairable redundancy

Verfahren und Vorrichtung zum Messen einer Temperatur in einem integrierten Halbleiterbauelement

Method and device for measuring a temperature in an electronic component

Circuit for setting a signal propagation time for a signal on a signal line and method for ascertaining timing parameters

Dynamic random access memory semiconductor storage component functional capability testing method, involves testing functional capability of regular storage area together with redundant storage area, and deactivating defective cells

Loop-back-Verfahren zur Vermessung des Interface-Timings von Halbleitervorrichtungen mit Hilfe von Signaturen und/oder Paritätsverfahren