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Dive into the research topics where Melanie Etherton is active.

Publication


Featured researches published by Melanie Etherton.


electrical overstress electrostatic discharge symposium | 2015

P2P and Rmap - new software tool for quick and easy verification of power nets

Maxim Ershov; Meruzhan Cadjan; Yuri Feinberg; Thomas Jochum; Scott Ruth; Melanie Etherton

A new software tool, P2P, for electrical simulation of power nets is presented. The Rmap functionality of P2P calculates resistances from specified starting points to all points on the net, and visualizes the results in resistance color maps - which enables quick identification and debugging of layout errors. P2P also enables point-to-point resistance calculation, IR voltage drop analysis, and current density verification. Case studies are presented for overall power/ground net verification, and for specific tasks of guard ring and ESD device resistance and current density verification.


electrical overstress electrostatic discharge symposium | 2015

A new full-chip verification methodology to prevent CDM oxide failures

Melanie Etherton; Scott Ruth; James W. Miller; Rishabh Agarwal; Rishi Bhooshan; Maxim Ershov; Meruzhan Cadjan; Yuri Feinberg; Karthik Srinivasan; Norman Chang; Youlin Liao

This paper describes a new full-chip CDM ESD verification method that enables the evaluation of complete integrated circuits (ICs) for CDM risk. We demonstrate that a robust analysis must comprehend millions of locations of driver-receiver (D/R) pairs on an IC, an accurate model of the grid resistance and an adequate representation of the CDM current distribution.


international conference on ic design and technology | 2014

RC triggered active ESD clamps; How should they behave under powered conditions?

James W. Miller; Michael Stockinger; Scott Ruth; Alex Gerdemann; Melanie Etherton; Mohamed S. Moosa

Problems with standard RC clamp circuits during powered system level ESD events are reviewed. A new clamp design is presented which employs a proportional triggering scheme that regulates the pad voltage during transient events, rather than simply switching the clamps fully on or off.


custom integrated circuits conference | 2012

Electronic design automation (EDA) solutions for ESD-robust design and verification

Michael Khazhinsky; Shuqing Cao; Harald Gossner; Gianluca Boselli; Melanie Etherton

The paper describes the essential requirements of the Electrostatic Discharge (ESD) EDA verification flow to be aligned within the IC design community. The proposed flow offers a systematic approach to check ESD robustness across all IC blocks during the product definition, chip architecture, main module and full IC design phases, and during the final IC verification. This flow is substantiated by case studies of key ESD checks at different IC design stages, demonstrating the necessity of replacing manual checks with EDA tool enabled verification.


Archive | 2007

Distributed electrostatic discharge protection circuit with varying clamp size

James W. Miller; Melanie Etherton; Michael G. Khazhinsky; Michael Stockinger


Archive | 2008

Method and circuit for efuse protection

Melanie Etherton; Michael G. Khazhinsky; Eyal Melamed-Kohen; Valery Neiman


electrical overstress/electrostatic discharge symposium | 2006

Comprehensive ESD protection for flip-chip products in a dual gate oxide 65nm CMOS technology

James W. Miller; Melanie Etherton; Michael G. Khazhinsky; Michael Stockinger; James C. Weldon


electrical overstress/electrostatic discharge symposium | 2013

Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps

Scott Ruth; James W. Miller; Alex Gerdemann; Michael Stockinger; Melanie Etherton; Mohamed S. Moosa; Allan Dobbin; Robert Mertens; Kuo Hsuan Meng; Elyse Rosenbaum; Paolo Colombo; Martina Cordoni; Nicolas Guitard


electrical overstress electrostatic discharge symposium | 2008

HBM ESD failures caused by a parasitic pre-discharge current spike

Melanie Etherton; Victor Axelrod; Tom Meuse; James W. Miller; Haim Marom


electrical overstress/electrostatic discharge symposium | 2013

EDA software for verification of metal interconnects in ESD protection networks at chip, block, and cell level

Maxim Ershov; Yuri Feinberg; Meruzhan Cadjan; David Klein; Melanie Etherton

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Scott Ruth

Freescale Semiconductor

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Allan Dobbin

Freescale Semiconductor

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David Klein

Freescale Semiconductor

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