Melanie Etherton
Freescale Semiconductor
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Publication
Featured researches published by Melanie Etherton.
electrical overstress electrostatic discharge symposium | 2015
Maxim Ershov; Meruzhan Cadjan; Yuri Feinberg; Thomas Jochum; Scott Ruth; Melanie Etherton
A new software tool, P2P, for electrical simulation of power nets is presented. The Rmap functionality of P2P calculates resistances from specified starting points to all points on the net, and visualizes the results in resistance color maps - which enables quick identification and debugging of layout errors. P2P also enables point-to-point resistance calculation, IR voltage drop analysis, and current density verification. Case studies are presented for overall power/ground net verification, and for specific tasks of guard ring and ESD device resistance and current density verification.
electrical overstress electrostatic discharge symposium | 2015
Melanie Etherton; Scott Ruth; James W. Miller; Rishabh Agarwal; Rishi Bhooshan; Maxim Ershov; Meruzhan Cadjan; Yuri Feinberg; Karthik Srinivasan; Norman Chang; Youlin Liao
This paper describes a new full-chip CDM ESD verification method that enables the evaluation of complete integrated circuits (ICs) for CDM risk. We demonstrate that a robust analysis must comprehend millions of locations of driver-receiver (D/R) pairs on an IC, an accurate model of the grid resistance and an adequate representation of the CDM current distribution.
international conference on ic design and technology | 2014
James W. Miller; Michael Stockinger; Scott Ruth; Alex Gerdemann; Melanie Etherton; Mohamed S. Moosa
Problems with standard RC clamp circuits during powered system level ESD events are reviewed. A new clamp design is presented which employs a proportional triggering scheme that regulates the pad voltage during transient events, rather than simply switching the clamps fully on or off.
custom integrated circuits conference | 2012
Michael Khazhinsky; Shuqing Cao; Harald Gossner; Gianluca Boselli; Melanie Etherton
The paper describes the essential requirements of the Electrostatic Discharge (ESD) EDA verification flow to be aligned within the IC design community. The proposed flow offers a systematic approach to check ESD robustness across all IC blocks during the product definition, chip architecture, main module and full IC design phases, and during the final IC verification. This flow is substantiated by case studies of key ESD checks at different IC design stages, demonstrating the necessity of replacing manual checks with EDA tool enabled verification.
Archive | 2007
James W. Miller; Melanie Etherton; Michael G. Khazhinsky; Michael Stockinger
Archive | 2008
Melanie Etherton; Michael G. Khazhinsky; Eyal Melamed-Kohen; Valery Neiman
electrical overstress/electrostatic discharge symposium | 2006
James W. Miller; Melanie Etherton; Michael G. Khazhinsky; Michael Stockinger; James C. Weldon
electrical overstress/electrostatic discharge symposium | 2013
Scott Ruth; James W. Miller; Alex Gerdemann; Michael Stockinger; Melanie Etherton; Mohamed S. Moosa; Allan Dobbin; Robert Mertens; Kuo Hsuan Meng; Elyse Rosenbaum; Paolo Colombo; Martina Cordoni; Nicolas Guitard
electrical overstress electrostatic discharge symposium | 2008
Melanie Etherton; Victor Axelrod; Tom Meuse; James W. Miller; Haim Marom
electrical overstress/electrostatic discharge symposium | 2013
Maxim Ershov; Yuri Feinberg; Meruzhan Cadjan; David Klein; Melanie Etherton