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Featured researches published by Munehiro Yamada.


electronic components and technology conference | 2006

Impact strength evaluation of solder joints in BGA by dropping steel rod

Akihiro Yaguchi; Naotaka Tanaka; Yasuhiro Naka; Kenichi Yamamoto; Ryosuke Kimoto; Munehiro Yamada

The solder joints of ball grid array (BGA) packages in mounted in portable electronic devices like mobile phones suffer mechanical shock when the device is dropped during use. Accordingly, along with developing a quantitative method for evaluating the impact strength of BGA solder joints, improving the strength of these solder joints against such shocks are necessary. In the current work, aiming to establish this quantitative evaluation method, the authors developed an impact-testing procedure based on three-point bending produced by the impact of a drop steel rod on to a printed wiring board (PWB) mounting a BGA package. With the developed test, a PWB can be repeatedly subjected to impact bending deformation in a simple and stable manner. Since the test can reproduce the same mechanical impact as that suffered when a portable electronic device is dropped during use, it is well suited to strength evaluation during the development stage of BGA packages. In the strength evaluation, the maximum value of strain generated in the corner region of the package is used. A strong relationship between the maximum strain and solder-joint strength was found. Moreover, the impact strength of the solder joint depends on the rise time of strain in the PWB, namely, as rise time shortens, impact strength falls


Archive | 2003

Semiconductor device with joint structure having lead-free solder layer over nickel layer

Kenichi Yamamoto; Toshiaki Morita; Munehiro Yamada; Ryosuke Kimoto


Archive | 2002

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME, ELECTRONIC DEVICE AND METHOD OF MANUFACTURING THE SAME

Ryosuke Kimoto; Toshiaki Morita; Munehiro Yamada; Kenichi Yamamoto; 俊章 守田; 健一 山本; 宗博 山田; 良輔 木本


Archive | 2001

Impact test method, impact testing device and reliability evaluation method of semiconductor device

Shinji Fukushima; Akihiro Yaguchi; Munehiro Yamada; 宗博 山田; 昭弘 矢口; 伸二 福島


Journal of Japan Institute of Electronics Packaging | 2003

Reliability Evaluation of Solder Joints in Ball-Grid-Array-Type Packages by Impact Bending Test

Akihiro Yaguchi; Munehiro Yamada; Kenichi Yamamoto


Archive | 2003

Method for manufacturing semiconductor device and electronic device and method for calculating connection condition

Shiro Yamashita; Masahide Harada; Kenichi Yamamoto; Munehiro Yamada; Ryosuke Kimoto


Journal of Japan Institute of Electronics Packaging | 2003

A Design Method for Estimating the Reliability of Lead Free Solder Joints in Ball-Grid-Array-Type Packages under Impact Load

Akihiro Yaguchi; Munehiro Yamada; Kenichi Yamamoto


Archive | 2005

METHOD AND DEVICE FOR MACHINING INNER SURFACE OF DIFFERENTIAL CASE

Munehiro Yamada; 宗博 山田


Archive | 2002

Semiconductor package and its mounting structure

Akihiro Yaguchi; Munehiro Yamada; Kenichi Yamamoto; 山本 健一; 山田 宗博; 矢口 昭弘


Transactions of the Japan Society of Mechanical Engineers. A | 2005

Fatigue Strength of BGA Type Solder Joints between Package and Printed Wiring Board of Portable Device

Kohta Nagano; Akihiro Yaguchi; Takeshi Terasaki; Munehiro Yamada

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