Akihiro Yaguchi
Hitachi
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by Akihiro Yaguchi.
electronic components and technology conference | 2006
Akihiro Yaguchi; Naotaka Tanaka; Yasuhiro Naka; Kenichi Yamamoto; Ryosuke Kimoto; Munehiro Yamada
The solder joints of ball grid array (BGA) packages in mounted in portable electronic devices like mobile phones suffer mechanical shock when the device is dropped during use. Accordingly, along with developing a quantitative method for evaluating the impact strength of BGA solder joints, improving the strength of these solder joints against such shocks are necessary. In the current work, aiming to establish this quantitative evaluation method, the authors developed an impact-testing procedure based on three-point bending produced by the impact of a drop steel rod on to a printed wiring board (PWB) mounting a BGA package. With the developed test, a PWB can be repeatedly subjected to impact bending deformation in a simple and stable manner. Since the test can reproduce the same mechanical impact as that suffered when a portable electronic device is dropped during use, it is well suited to strength evaluation during the development stage of BGA packages. In the strength evaluation, the maximum value of strain generated in the corner region of the package is used. A strong relationship between the maximum strain and solder-joint strength was found. Moreover, the impact strength of the solder joint depends on the rise time of strain in the PWB, namely, as rise time shortens, impact strength falls
Journal of The Society of Materials Science, Japan | 1998
Akihiro Yaguchi; Asao Nishimura
Epoxy resins for encapsulating integrated circuit (IC) devices are filled with silica particles to reduce the thermal expansion coefficient and to improve thermal conductivity. Recently, the size of chips mounted in a package has increased rapidly with advances in large-scale integration technology. This trend creates a problem : increased mechanical stress in the package, which sometimes causes cracking in the encapsulation resin under temperature cycling. Hence, evaluation of the fracture properties of these materials has become an important issue in package design. This study reports the effects of the filler particle volume fraction on the static strength of smooth specimens and fracture toughness of silica-particulate -filled epoxy resins for IC encapsulation. The smooth specimen strength and fracture toughness were measured, respectively, by the three-point bending test and the double torsion test. It was found that the fracture toughness increased with increasing volume fraction. The static strength of epoxy resins with a small amount of silica particulate was smaller than that of unfilled resins. The crack propagation in resins containing 30% volume fraction of large size particles was unstable. At larger than 45% volume fraction of particles, the crack propagation was stable. These crack propagation properties have been related to the plastic zone size of matrix and particle spacing.
Archive | 1994
Makoto Kitano; Asao Nishimura; Akihiro Yaguchi; Nae Yoneda; Ryuji Kohno; Naotaka Tanaka; Tetsuo Kumazawa
Archive | 1991
Ryuji Kohno; Asao Nishimura; Makoto Kitano; Akihiro Yaguchi; Nae Yoneda
Archive | 1990
Makoto Kitano; Asao Nishimura; Akihiro Yaguchi; Sueo Kawai; Akio Hoshi; Ichio Shimizu
Archive | 1995
Asao Nishimura; Akihiro Yaguchi; Mitsuaki Haneda; Ichiro Anjoh; Junichi Arita; Akihiko Iwaya; Masahiro Ichitani
Archive | 1995
Tetsuo Kumazawa; Makoto Kitano; Akihiro Yaguchi; Ryuji Kohno; Naotaka Tanaka; Nae Yoneda; Ichiro Anjoh
Archive | 1992
Akihiro Yaguchi; Asao Nishimura; Makoto Kitano; Ichiro Anjoh; Junichi Arita
Archive | 1991
Ryuji Kohno; Makoto Kitano; Asao Nishimura; Akihiro Yaguchi; Sueo Kawai
Archive | 2001
Atsushi Kazama; Hideo Miura; Akihiro Yaguchi