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Dive into the research topics where Philip George Shephard is active.

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Featured researches published by Philip George Shephard.


Ibm Journal of Research and Development | 2007

IBM POWER6 microprocessor physical design and design methodology

Rex Berridge; Robert M. Averill; Arnold E. Barish; Michael A. Bowen; Peter J. Camporese; Jack DiLullo; Peter E. Dudley; Joachim Keinert; David W. Lewis; Robert D. Morel; Thomas Edward Rosser; Nicole S. Schwartz; Philip George Shephard; Howard H. Smith; Dave Thomas; Phillip J. Restle; John R. Ripley; Stephen Larry Runyon; Patrick M. Williams

The IBM POWER6™ microprocessor is a 790 million-transistor chip that runs at a clock frequency of greater than 4 GHz. The complexity and size of the POWER6 microprocessor, together with its high operating frequency, present a number of significant challenges. This paper describes the physical design and design methodology of the POWER6 processor. Emphasis is placed on aspects of the design methodology, technology, clock distribution, integration, chip analysis, power and performance, random logic macro (RLM), and design data management processes that enabled the design to be completed and the project goals to be met.


Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing | 1994

Cost trade-offs of various design for test techniques

Howard B. Druckerman; Mary P. Kusko; Stephen V. Pateras; Philip George Shephard

Test cost is becoming a major factor in todays complex chip designs. One approach to lower test cost is to have the product test, or help test, itself. There are a wide variety of Design-for-Test techniques that have been developed for this purpose. A number of these techniques are evaluated against various related cost issues.


Archive | 1995

Programmable built-in self test method and controller for arrays

Philip George Shephard; William V. Huott; Paul R. Turgeon; Robert W. Berry; Gulsun Yasar; Frederick J. Cox; Pradip Patel; Joseph B. Hanley


Archive | 2001

JTAG-based software to perform cumulative array repair

Christopher J. Engel; Norman K. James; Brian Chan Monwai; Kevin Franklin Reick; Philip George Shephard; Marco Zamora


Archive | 1999

Programmable array built-in self test method and controller with programmable expect generator

Philip George Shephard


Archive | 1993

Method and apparatus for memory dynamic burn-in and test.

Robert W. Berry; Bernd Koenemann; William J. Scarpero; Philip George Shephard; Kenneth D. Wagner; Gulsun Yasar


Archive | 1999

Method and apparatus for selectively enabling and disabling functions on a per array basis

Philip George Shephard


Archive | 2003

Test method for guaranteeing full stuck-at-fault coverage of a memory array

Jose Angel Paredes; Philip George Shephard; Timothy M. Skergan; Neil Ray Vanderschaaf


Archive | 1999

System and method of generating dynamic word line from the content addressable memory (CAM) “hit/miss” signal which is scannable for testability

Chi Duy Bui; T. W. Griffith; Manoj Kumar; Terry Lee Leasure; Philip George Shephard


Archive | 2006

Multiple mode approach to building static timing models for digital transistor circuits

Jeffrey P. Soreff; Philip George Shephard; Fred L. Yang; Vasant B. Rao

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