Pon Sung Ku
Freescale Semiconductor
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Publication
Featured researches published by Pon Sung Ku.
international reliability physics symposium | 2006
Pon Sung Ku; Young Sir Chung
Reliability of AlOx magnetic tunnel junction (MTJ) devices is studied by investigating resistance drift behaviors under various stress conditions. Both reversible and permanent traps processes are observed during stress. Under unipolar pulsed stress, the resistance drift reveals a strong dependence on the operation frequency and duty cycle, which is believed to be attributed to the kinetics of reversible traps. Relative reliability performance of MTJ devices is analyzed from the resistance drift respects
Archive | 2006
Young Sir Chung; Robert W. Baird; Mark A. Durlam; Pon Sung Ku
Archive | 2012
Ganming Qin; Edouard D. de Frésart; Peilin Wang; Pon Sung Ku
Archive | 2014
Ganming Qin; Edouard D. de Frésart; Pon Sung Ku; Michael F. Petras; Moaniss Zitouni; Dragan Zupac
Archive | 2017
Ganming Qin; Edouard D. de Frésart; Pon Sung Ku; Michael F. Petras; Moaniss Zitouni; Dragan Zupac
Archive | 2014
Moaniss Zitouni; Edouard D. de Frésart; Pon Sung Ku; Ganming Qin
Archive | 2012
Peilin Wang; Jingjing Chen; Edouard D. de Frésart; Pon Sung Ku; Wenyi Li; Ganming Qin
Archive | 2016
Ganming Qin; Edouard D. de Frésart; Pon Sung Ku; Michael F. Petras; Moaniss Zitouni; Dragan Zupac
Archive | 2015
Moaniss Zitouni; Edouard D. de Frésart; Pon Sung Ku; Michael F. Petras; Ganming Qin; Evgueniy Stefanov; Dragan Zupac
Archive | 2015
Pon Sung Ku; Edouard D. de Frésart; Ganming Qin; Moaniss Zitouni; Dragan Zupac
