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Dive into the research topics where Raul-Adrian Cernea is active.

Publication


Featured researches published by Raul-Adrian Cernea.


IEEE Journal of Solid-state Circuits | 2009

A 34 MB/s MLC Write Throughput 16 Gb NAND With All Bit Line Architecture on 56 nm Technology

Raul-Adrian Cernea; Long Pham; Farookh Moogat; Siu Chan; Binh Le; Yan Li; Shouchang Tsao; Tai-Yuan Tseng; Khanh Nguyen; Jason Li; Jayson Hu; Jong Hak Yuh; Cynthia Hsu; Fanglin Zhang; Teruhiko Kamei; Hiroaki Nasu; Phil Kliza; Khin Htoo; Jeffrey W. Lutze; Yingda Dong; Masaaki Higashitani; Junnhui Yang; Hung-Szu Lin; Vamshi Sakhamuri; Alan Li; Feng Pan; Sridhar Yadala; Subodh Taigor; Kishan Pradhan; James Lan

A 16 Gb 4-state MLC NAND flash memory augments the sustained program throughput to 34 MB/s by fully exercising all the available cells along a selected word line and by using additional performance enhancement modes. The same chip operating as an 8 Gb SLC device guarantees over 60 MB/s programming throughput. The newly introduced all bit line (ABL) architecture has multiple advantages when higher performance is targeted and it was made possible by adopting the ldquocurrent sensingrdquo (as opposed to the mainstream ldquovoltage sensingrdquo) technique. The general chip architecture is presented in contrast to a state of the art conventional circuit and a double size data buffer is found to be necessary for the maximum parallelism attained. Further conceptual changes designed to counterbalance the area increase are presented, hierarchical column architecture being of foremost importance. Optimization of other circuits, such as the charge pump, is another example. Fast data access rate is essential, and ways of boosting it are described, including a new redundancy scheme. ABL contribution to energy saving is also acknowledged.


international solid-state circuits conference | 2009

A 5.6MB/s 64Gb 4b/Cell NAND Flash memory in 43nm CMOS

Cuong Trinh; Noboru Shibata; T. Nakano; M. Ogawa; Jumpei Sato; Yasuhisa Takeyama; K. Isobe; Binh Le; Farookh Moogat; Nima Mokhlesi; Kenji Kozakai; Patrick Hong; Teruhiko Kamei; K. Iwasa; J. Nakai; Takahiro Shimizu; Mitsuaki Honma; S. Sakai; T. Kawaai; S. Hoshi; Jonghak Yuh; Cynthia Hsu; Taiyuan Tseng; Jason Li; Jayson Hu; Martin Liu; Shahzad Khalid; Jiaqi Chen; Mitsuyuki Watanabe; Hungszu Lin

Today NAND Flash memory is used for data and code storage in digital cameras, USB devices, cell phones, camcorders, and solid-state disk drives. Figure 13.6.1 shows the memory-density trend since 2003. To satisfy the market demand for lower cost per bit and higher density nonvolatile memory, in addition to technology scaling, 2b/cell MLC technology was introduced. Recently, MLC NAND flash memories with more than 2b/cell [1,2] have been reported.


international solid-state circuits conference | 2008

A 34MB/s-Program-Throughput 16Gb MLC NAND with All-Bitline Architecture in 56nm

Raul-Adrian Cernea; Long Pham; Farookh Moogat; Siu Chan; Binh Le; Yan Li; Shouchang Tsao; Tai-Yuan Tseng; Khanh Nguyen; Jason Li; J. Hu; Jong Park; Cynthia Hsu; Fanglin Zhang; Teruhiko Kamei; Hiroaki Nasu; Phil Kliza; Khin Htoo; Jeffrey W. Lutze; Yingda Dong; Masaaki Higashitani; Junhui Yang; Hung-Szu Lin; Vamshi Sakhamuri; A. Li; Feng Pan; Sridhar Yadala; Subodh Taigor; Kishan Pradhan; James Lan

In the diverse world of NAND flash applications, higher storage capacity is not the only imperative. Increasingly, performance is a differentiating factor and is also a way of creating new markets or expanding existing markets. While conventional memory uses, for actual operations, every other cell along a selected word line (WL) (Takeuchi, 2006), this design simultaneously exercises them all. A performance improvement of at least 100% is derived from this all-bitline (ABL) architecture relative to conventional chips. Additional techniques push performance to even higher levels.


Archive | 2002

Techniques for reducing effects of coupling between storage elements of adjacent rows of memory cells

Raul-Adrian Cernea; Khandker N. Quader; Yan Li; Jian Chen; Yupin Fong


Archive | 2003

Non-volatile memory and method with improved sensing

Raul-Adrian Cernea; Yan Li


Archive | 1996

Concurrent write of multiple chunks of data into multiple subarrays of flash EEPROM

Douglas J. Lee; Mehrdad Mofidi; Sanjay Mehrotra; Raul-Adrian Cernea


Archive | 2010

Non-volatile memory and method with shared processing for an aggregate of read/write circuits

Raul-Adrian Cernea; Yan Li; Shahzad Khalid; Siu Lung Chan


Archive | 2002

Non-Volatile Memory And Method With Reduced Neighboring Field Errors

Raul-Adrian Cernea; Yan Li


Archive | 2002

Non-Volatile Memory and Method With Reduced Source Line Bias Errors

Raul-Adrian Cernea; Yan Li


Archive | 2003

Non-volatile memory with improved sensing and method therefor

Raul-Adrian Cernea; Rushyah Tang; Douglas J. Lee; Chi-Ming Wang; Daniel C. Guterman

Collaboration


Dive into the Raul-Adrian Cernea's collaboration.

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