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Dive into the research topics where Ray Chuang is active.

Publication


Featured researches published by Ray Chuang.


Archive | 2006

Post ECP multi-step anneal/H2 treatment to reduce film impurity

Hsien-Ping Feng; Jung-Chih Tsao; Hsi-Kuei Cheng; Chih-Tsung Lee; Ming-Yuan Cheng; Steven Lin; Ray Chuang; Chi-Wen Liu


Archive | 2003

Novel method to reduce Rs pattern dependence effect

Jung-Chih Tsao; Chi-Wen Li; Kei-Wei Chen; Jye-Wei Hsu; Hsien-Pin Fong; Steven Lin; Ray Chuang


Archive | 2005

Systems and methods for wafer cleaning

Hsien-Ping Feng; Min-Yuan Cheng; Jia-Jia Lin; Chieh-Tsao Wang; Shu-Wen Fu; Steven Lin; Ray Chuang


Archive | 2005

Method for electrochemical plating on semiconductor wafers

Hsi-Kuei Cheng; Steven Lin; Chih-Chang Huang; Tzu-Ling Liao; Hsien-Ping Peng; Ming-Yuan Cheng; Ying-Jing Lu; Chieh-Tsao Wang; Ray Chuang; Chen-Peng Fan


Archive | 2005

Metallization target optimization method providing enhanced metallization layer uniformity

Hsi-Kuei Cheng; Chieh-Tsao Wang; Hsien-Ping Feng; Min-Yuan Cheng; Jung-Chin Tsao; Steven Lin; Ray Chuang; Chyi-Tsong Ni


Archive | 2003

Method of reducing the pattern effect in the CMP process

Chi-Wen Liu; Jung-Chih Tsao; Shien-Ping Feng; Kei-Wei Chen; Shih-Chi Lin; Ray Chuang


Archive | 2006

Apparatus and method for preventing copper peeling in ECP

Hsi-Kuei Cheng; Jung-Chih Tsao; Hsien-Ping Feng; Ming-Yuan Cheng; Steven Lin; Ray Chuang


Archive | 2003

Method to reduce Rs pattern dependence effect

Jung-Chih Tsao; Chi-Wen Li; Kei-Wei Chen; Jye-Wei Hsu; Hsien-Pin Fong; Steven Lin; Ray Chuang


Archive | 2003

Thrust pad assembly for ECP system

Jung-Chih Tsao; Kei-Wei Chen; Chi-Wen Liu; Shi-Chi Lin; Ray Chuang


Archive | 2006

Method of reducing oxygen content in ECP solution

Ming-Yuan Cheng; Hsien-Ping Feng; Hsi-Kuei Cheng; Kei-Wei Chen; Jung-Chin Tsao; Steven Lin; Ray Chuang

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