Robert Ashton

Multi-channel, high-density, ultra-low capacitance arrays for ESD and surge protection

A novel protection device providing ultra-low line capacitance and improved ESD (J. E. Vinson et al., 2003) and surge capability is presented. Applications include stand-alone protection arrays and integrated protection in baseband- or RF-filters. A proprietary epitaxial layer and isolation capability enable high levels of surge power handling capability, while keeping line capacitance low and reducing device footprint. The response of the device to ESD and surge stresses is investigated at wafer- and package-level. Process condition variations and derived structures are studied, along with a consideration of issues related to the measurement of capacitance, ESD and surge capability.

HMM single site testing: Can we reproduce component failure level with the HMM document?

The ESDA working group 5.6 has conducted single site testing to evaluate the repeatability of passfail results when using the setups in the standard practice 5.6 document. A ten times lower standard deviation is obtained in comparison to the 2011 round robin.

JS-002 module and product CDM result comparison to JEDEC and ESDA CDM methods

CDM standard JS-002 is introduced, including the reasons for its development and the technical issues the new standard addresses. JS-002 is compared to the JEDEC JESD22-C101, ESDA and AEC Q100 CDM standards in terms of waveforms and integrated circuit pass/fail levels. JS-002 robustness levels are similar to JEDEC CDM levels.