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Dive into the research topics where Roberto Bez is active.

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Featured researches published by Roberto Bez.


international electron devices meeting | 2009

Chalcogenide PCM: a memory technology for next decade

Roberto Bez

Phase Change Memory (PCM) technology is demonstrating the capability to enter the broad memory market and to be a mainstream memory for the next decade. PCM provides a new set of features interesting for novel applications, combining components of NVM and DRAM and being at the same time a sustaining and a disruptive technology. In this paper the PCM technology status is reviewed and future development lines are drawn, showing that the technology maturity achieved, the scaling perspective and the broad application range allow predicting a key role for the PCM technology in the memory market in the next decade.


non volatile memory technology symposium | 2009

Reliability characterization of Phase Change Memory

Bob Gleixner; Fabio Pellizzer; Roberto Bez

Phase Change Memory (PCM) has emerged as an attractive candidate for next-generation non-volatile memory devices. For these applications, reliability is determined by the ability to retain the state of data in the device and support a specified number of re-writes without failure. In PCM technologies, retention is limited by the meta-stable amorphous state of the cell. For cycling endurance (re-writes), failure occurs due to either void formation in the active material or contamination of the heating element of the cell. With optimized process integration and cell programming, large array devices based on a 90nm PCM technology are able to support data retention to 10 years at 85 °C and greater than 106 write cycles.


international symposium on vlsi design, automation and test | 2012

Emerging memory technology perspective

Roberto Bez; Paolo Cappelletti

Memories are getting increasing importance since they are becoming fundamental in the definition of the electronic system. Presently the industry standard technologies are still DRAM and Flash that have been able to guarantee the cost sustainability thanks to the continuous scaling. The NAND/DRAM miniaturization is becoming increasingly difficult and moreover new applications are requiring higher memory density and better performances. Therefore there are good opportunities for the alternative memory technologies to enter into the market and replace/displace the standard ones.


international memory workshop | 2010

Phase Change Memory development trends

Roberto Bez; S. Bossi; B. Gleixner; F. Pellizzer; Agostino Pirovano; G. Servalli; M. Tosi

At the beginning of this decade, in early 2000, few disruptive technologies had been proposed to replace the industry standard Non-Volatile Memory (NVM) technology and to enlarge the Flash application base [1]. A widely accepted statement was that if any technology will succeed, it will materialize in the next decade.


Archive | 2002

A memory device

Roberto Bez; Giulio Casagrande; Wolodymyr Czubatyj; Stephen J. Hudgens; Tyler Lowrey; Edward J. Spall; Guy Wicker


Archive | 2002

Minute contact area in semiconductor device, high performance phase change memory cell and method of manufacturing the memory cell

Roberto Bez; Fabio Pellizzer; Caterina Riva; Romina Zonca; カテリーナ・リーヴァ; ファビオ・ペリゼール; ロベルト・ベズ; ロミーナ・ゾンカ


Archive | 2011

Status and Perspective of Chalcogenide PCM in the Semiconductor Industry

Roberto Bez; Agostino Pirovano; C. Olivetti


Archive | 2009

Reliability Characterization ofPhase Change Memory

Bob Gleixner; Fabio Pellizzer; Roberto Bez; Via C. Olivetti


Archive | 2007

Phasenwechselspeicherbauelement Phase change memory device

Ferdinando Bedeschi; Roberto Bez; Roberto Gastaldi; Fabio Pellizzer


Archive | 2006

Elektrische Sicherungsstruktur auf der Basis eines Phasenwechselspeicherelements und entsprechendes Programmierverfahren Electrical fuse structure on the basis of a phase change memory element and corresponding programming method

Fabio Pellizzer; Innocenzo Tortorelli; Agostino Pirovano; Roberto Bez

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