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Dive into the research topics where Rudy F. Garcia is active.

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Featured researches published by Rudy F. Garcia.


Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena | 2015

Protection of extreme ultraviolet lithography masks. I. Thermophoretic protection factors at low pressure for diffusing nanoscale particles

Leonard E. Klebanoff; Anthony S. Geller; John R. Torczynski; Michael A. Gallis; Daniel J. Rader; Frank Chilese; Rudy F. Garcia; Gil Delgado

Model calculations are presented for thermophoretic protection of an extreme ultraviolet (EUV) mask placed face down in an EUV mask inspection tool. The protection factors, defined as the ratio of challenge particles to deposited particles, are calculated for a variety of test conditions (temperature gradient, gas type, particle density, and particle position) for a reticle bathed in clean gas from a facing showerhead. Thermophoretic protection (in combination with gravity) provides robust protection for particle sizes greater than ∼20 nm. However, for particle sizes less than ∼20 nm, protection falters quickly and is severely degraded for highly diffusing 10 nm particles that are of concern for mask contamination. Estimates are made for the required level of particle protection in both EUV mask inspection and EUV projection lithography. When compared with these estimates for the required protection, it is clear that thermophoresis alone cannot successfully defend against particles smaller than ∼20 nm, an...


Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena | 2015

Protection of extreme ultraviolet lithography masks. II. Showerhead flow mitigation of nanoscale particulate contamination

Leonard E. Klebanoff; John R. Torczynski; Anthony S. Geller; Michael A. Gallis; Daniel J. Rader; Frank Chilese; Rudy F. Garcia; Gil Delgado

An analysis is presented of a method to protect the reticle (mask) in an extreme ultraviolet (EUV) mask inspection tool using a showerhead plenum to provide a continuous flow of clean gas over the surface of a reticle. The reticle is suspended in an inverted fashion (face down) within a stage/holder that moves back and forth over the showerhead plenum as the reticle is inspected. It is essential that no particles of 10-nm diameter or larger be deposited on the reticle during inspection. Particles can originate from multiple sources in the system, and mask protection from each source is explicitly analyzed. The showerhead plate has an internal plenum with a solid conical wall isolating the aperture. The upper and lower surfaces of the plate are thin flat sheets of porous-metal material. These porous sheets form the top and bottom showerheads that supply the region between the showerhead plate and the reticle and the region between the conical aperture and the Optics Zone box with continuous flows of clean ...


Archive | 2005

Systems configured to reduce distortion of a resist during a metrology process and systems and methods for reducing alteration of a specimen during analysis

Peter D. Nunan; Muhran Nasser-Ghodsi; Mark Borowicz; Rudy F. Garcia; Tzu Chin Chuang; Herschel Marchman; David A. Soltz


Archive | 2007

Etch selectivity enhancement in electron beam activated chemical etch

Mehran Naser-Ghodsi; Garrett Pickard; Rudy F. Garcia; Tzu-Chin Chuang; Ming Lun Yu; Kenneth Krzeczowski; Matthew Lent; Sergey Lopatin; Chris Huang; Niles Kenneth MacDonald


Archive | 2007

Structural modification using electron beam activated chemical etch

Mehran Naser-Ghodsi; Garrett Pickard; Rudy F. Garcia; Ming Lun Yu; Kenneth Krzeczowski; Matthew Lent; Sergey Lopatin; Chris Huang; Niles Kenneth MacDonald


Archive | 2005

Methods and systems for measuring a characteristic of a substrate or preparing a substrate for analysis

Mehran Nasser-Ghodsi; Mark Borowicz; Dave Bakker; Mehdi Vaez-Iravani; Prashant Aji; Rudy F. Garcia; Tzu Chin Chuang


Archive | 2014

SYSTEM AND METHOD FOR GENERATION OF EXTREME ULTRAVIOLET LIGHT

Alexander Bykanov; Oleg Khodykin; Daniel Wack; Konstantin Tsigutkin; Layton Hale; Joseph Walsh; Frank Chilese; Rudy F. Garcia; Brian Ahr


Archive | 2007

Etch selectivity enhancement, deposition quality evaluation, structural modification and three-dimensional imaging using electron beam activated chemical etch

Mehran Nasser-Ghodsi; Sergey Lopatin; Garrett Pickard; Rudy F. Garcia; Ming Lun Yu; Kenneth Krzeczowski; Matthew Lent; Chris Huang; Niles Kenneth MacDonald; Stanislaw Marek Borowicz; Tzu-Chin Chuang


Archive | 2012

Apparatus and methods for forming an electrical conduction path through an insulating layer

Tomas Plettner; Mehran Nasser-Ghodsi; Robert Haynes; Rudy F. Garcia


Archive | 2004

Transverse magnetic field voltage isolator

Alexander Jozef Gubbens; Niles Kenneth MacDonald; Mehran Nasser-Ghodsi; Rudy F. Garcia; Doug K. Masnaghetti

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Anthony S. Geller

Sandia National Laboratories

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