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Dive into the research topics where Frank Chilese is active.

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Featured researches published by Frank Chilese.


Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena | 2015

Protection of extreme ultraviolet lithography masks. I. Thermophoretic protection factors at low pressure for diffusing nanoscale particles

Leonard E. Klebanoff; Anthony S. Geller; John R. Torczynski; Michael A. Gallis; Daniel J. Rader; Frank Chilese; Rudy F. Garcia; Gil Delgado

Model calculations are presented for thermophoretic protection of an extreme ultraviolet (EUV) mask placed face down in an EUV mask inspection tool. The protection factors, defined as the ratio of challenge particles to deposited particles, are calculated for a variety of test conditions (temperature gradient, gas type, particle density, and particle position) for a reticle bathed in clean gas from a facing showerhead. Thermophoretic protection (in combination with gravity) provides robust protection for particle sizes greater than ∼20 nm. However, for particle sizes less than ∼20 nm, protection falters quickly and is severely degraded for highly diffusing 10 nm particles that are of concern for mask contamination. Estimates are made for the required level of particle protection in both EUV mask inspection and EUV projection lithography. When compared with these estimates for the required protection, it is clear that thermophoresis alone cannot successfully defend against particles smaller than ∼20 nm, an...


Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena | 2015

Protection of extreme ultraviolet lithography masks. II. Showerhead flow mitigation of nanoscale particulate contamination

Leonard E. Klebanoff; John R. Torczynski; Anthony S. Geller; Michael A. Gallis; Daniel J. Rader; Frank Chilese; Rudy F. Garcia; Gil Delgado

An analysis is presented of a method to protect the reticle (mask) in an extreme ultraviolet (EUV) mask inspection tool using a showerhead plenum to provide a continuous flow of clean gas over the surface of a reticle. The reticle is suspended in an inverted fashion (face down) within a stage/holder that moves back and forth over the showerhead plenum as the reticle is inspected. It is essential that no particles of 10-nm diameter or larger be deposited on the reticle during inspection. Particles can originate from multiple sources in the system, and mask protection from each source is explicitly analyzed. The showerhead plate has an internal plenum with a solid conical wall isolating the aperture. The upper and lower surfaces of the plate are thin flat sheets of porous-metal material. These porous sheets form the top and bottom showerheads that supply the region between the showerhead plate and the reticle and the region between the conical aperture and the Optics Zone box with continuous flows of clean ...


Archive | 2011

Recirculation high purity system for protecting optical modules or inspection system during storage, transport and shipping

Gildardo Delgado; Frank Chilese; Rudolf Brunner


Archive | 2014

SYSTEM AND METHOD FOR GENERATION OF EXTREME ULTRAVIOLET LIGHT

Alexander Bykanov; Oleg Khodykin; Daniel Wack; Konstantin Tsigutkin; Layton Hale; Joseph Walsh; Frank Chilese; Rudy F. Garcia; Brian Ahr


Archive | 2014

SPECTRAL PURITY FILTER AND LIGHT MONITOR FOR AN EUV ACTINIC RETICLE INSPECTION SYSTEM

Daimian Wang; Li Wang; Frank Chilese; David Alles


Archive | 2013

System and Method for Particle Control Near A Reticle

Gildardo Delgado; Frank Chilese


Archive | 2013

INDEXING OPTICS FOR AN ACTINIC EXTREME ULTRA-VIOLET (EUV) RETICLE INSPECTION TOOL

Gildardo Delgado; Frank Chilese


Archive | 2013

PARTICLE CONTROL NEAR RETICLE AND OPTICS USING SHOWERHEAD

Gildardo Delgado; Frank Chilese; Rudy F. Garcia; John Robert Torczynski; Anthony S. Geller; D. J. Rader; Leonard E. Klebanoff; Michail A. Gallis


Archive | 2013

Temperature control in EUV reticle inspection tool

Frank Chilese; Daniel Wack; Douglas Fowler


Archive | 2013

Smart memory alloys for an extreme ultra-violet (euv) reticle inspection tool

Gildardo Delgado; Frank Chilese

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Anthony S. Geller

Sandia National Laboratories

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Daniel J. Rader

University of Pennsylvania

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John R. Torczynski

Sandia National Laboratories

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Michael A. Gallis

Sandia National Laboratories

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