S. Elhamri

Significantly improved minority carrier lifetime observed in a long-wavelength infrared III-V type-II superlattice comprised of InAs/InAsSb

Time-resolved photoluminescence measurements reveal a minority carrier lifetime of >412 ns at 77 K under low excitation for a long-wavelength infrared InAs/InAs0.72Sb0.28 type-II superlattice (T2SL). This lifetime represents an order-of-magnitude increase in the minority carrier lifetime over previously reported lifetimes in long-wavelength infrared InAs/Ga1−xInxSb T2SLs. The considerably longer lifetime is attributed to a reduction of non-radiative recombination centers with the removal of Ga from the superlattice structure. This lifetime improvement may enable background limited T2SL long-wavelength infrared photodetectors at higher operating temperatures.

Demonstration of interface-scattering-limited electron mobilities in InAs/GaSb superlattices

The in-plane transport in InAs∕GaSb type-II superlattices (SLs) is a sensitive indicator of SL growth quality and of the eventual performance of devices made from these materials. The in-plane mobility of electrons that move predominantly in the InAs layer is affected by a number of intrinsic and extrinsic scattering mechanisms, including interface roughness scattering (IRS). The hallmark of classic IRS-limited transport in SLs and quantum wells is the sixth power dependence of mobility on layer width. While IRS-limited transport was demonstrated in a number of SL and quantum well systems, it has never been demonstrated in the important InAs∕GaSb SL material. In this paper, we perform temperature dependent Hall effect measurements on a series of InAs∕GaSb SLs with a fixed GaSb layer width and a variable InAs layer width d. The low temperature (10K) in-plane electron mobilities μ as a function of d behave as μ∝d6.20, which follows the classic sixth power dependence expected from theory. At the same time, t...

Growth of short-period InAs∕GaSb superlattices

The purpose of this work is to explore materials for midinfrared detectors that can operate at room temperature. Shorter-period InAs∕GaSb superlattices (SLs) have larger intervalance band separations, which are beneficial for reducing Auger recombination and tunneling current, thus making room temperature operation possible. To test these possibilities, several short-period SLs ranging from 50to11A were grown and their morphological properties were carefully monitored by transmission electron microscopy. The effect of structural degradation caused by the period reduction on the optical properties was studied using low-temperature photoluminescence (PL). The samples with larger periods (50–32A) showed excellent structural qualities and produced narrow full width at half maximum (FWHM) of the PL peak (5meV). As the period approached 24A, slight layer thickness undulations within the SLs were observed and these undulations intensified as the period further reduced to 17A. These structural degradations strong...

An electrical characterization of a two-dimensional electron gas in GaN/AlGaN on silicon substrates

We present results of transport measurements performed on AlGaN/GaN heterostructures grown on silicon substrates. Variable temperature Hall effect measurements revealed that the temperature dependence of the carrier density and mobility were characteristic of a two-dimensional electron gas (2DEG). Carrier densities greater than 1×1013 cm−2 and Hall mobilities in excess of 1500 cm2/V s were measured at room temperature. Variable field Hall measurements at low temperatures, and in magnetic fields up to 6 T, indicated that conduction is dominated by a single carrier type in these samples. Shubnikov–de Haas (SdH) measurements were also performed, but no oscillations were observed in fields up to 8 T and at temperatures as low as 1.2 K. Illuminating some of the samples with a blue (λ=470 nm) light emitting diode (LED) induced a persistent increase in the carrier density. SdH measurements were repeated and again no oscillations were present following illumination. However, exposing the samples to radiation from an UV (λ=395 nm) LED induced well-defined SdH oscillations in fields as low as 4 T. The observation of SdH oscillations confirmed the presence of a 2DEG in these structures. It is hypothesized that small angle scattering suppressed the oscillations before exposure to UV light. This conclusion is supported by the observed increase in the quantum scattering time, τq, with the carrier density and the calculated quantum to transport scattering times ratio, τq/τc. For instance, in one of the samples the τq increased by 32% while the τc changed by only 3% as the carrier density increased; an indication of an increase in the screening of small angle scattering. The absence of SdH oscillations in fields up to 8 T and at temperatures as low as 1.2 K is not unique to AlGaN/GaN on silicon. This behavior was observed in AlGaN/GaN on sapphire and on silicon carbide. SdH oscillations were observed in one AlGaN/GaN on silicon carbide sample following exposure to radiation from an UV LED.We present results of transport measurements performed on AlGaN/GaN heterostructures grown on silicon substrates. Variable temperature Hall effect measurements revealed that the temperature dependence of the carrier density and mobility were characteristic of a two-dimensional electron gas (2DEG). Carrier densities greater than 1×1013 cm−2 and Hall mobilities in excess of 1500 cm2/V s were measured at room temperature. Variable field Hall measurements at low temperatures, and in magnetic fields up to 6 T, indicated that conduction is dominated by a single carrier type in these samples. Shubnikov–de Haas (SdH) measurements were also performed, but no oscillations were observed in fields up to 8 T and at temperatures as low as 1.2 K. Illuminating some of the samples with a blue (λ=470 nm) light emitting diode (LED) induced a persistent increase in the carrier density. SdH measurements were repeated and again no oscillations were present following illumination. However, exposing the samples to radiation from...

Impact of growth temperature on InAs/GaInSb strained layer superlattices for very long wavelength infrared detection

We explore the optimum growth space for a 47.0 A InAs/21.5 A Ga0.75In0.25Sb superlattices (SLs) designed for the maximum Auger suppression for a very long wavelength infrared gap. Our growth process produces a consistent gap of 50 ± 5 meV. However, SL quality is sensitive to the growth temperature (Tg). For the SLs grown at 390−470 °C, a photoresponse signal gradually increases as Tg increases from 400 to 440 °C. Outside this temperature window, the SL quality deteriorates very rapidly. All SLs were n-type with mobility of ∼10 000 V/cm2 and 300 K recombination lifetime of ∼70 ns for an optimized SL.

Carrier mobility as a function of carrier density in type-II InAs/GaSb superlattices

We report on a study of the in-plane carrier mobility in InAs/GaSb superlattices as a function of carrier density. Instead of using a number of differently doped samples, we use the persistent-photoconductivity effect to vary the carrier density over a wide range from n- to p-type in single samples and perform Hall effect measurements. Hence, our data are not obscured by sample to sample nonuniformities. We demonstrate that low-temperature in-plane mobilities are limited by screened interface roughness scattering (IRS), although present models of two-dimensional carrier screening of IRS lead to a limited agreement with our data.

Post growth annealing study on long wavelength infrared InAs/GaSb superlattices

The impact of post growth annealing on the electrical properties of a long wavelength infrared type-II superlattice (SL) was explored. Quarters of a single SL wafer were annealed at 440 °C, 480 °C, and 515 °C, respectively for 30 min. Changes in the electrical properties were followed using spectral photoconductivity, temperature dependent Hall effect, and time-resolved pump-probe measurements. The bandgap energy remained at ∼107 meV for each anneal, and the photoresponse spectra showed a 25% improvement. The carrier lifetime increased from 12 to ∼15 ns with annealing. The electron mobility was nearly constant for the 440 °C and 480 °C anneals, and increased from ∼4500 to 6300 cm2/Vs for the 515 °C anneal.

Temperature-dependent minority carrier lifetimes of InAs/InAs 1-x Sb x type-II superlattices

Temperature-dependent minority carrier lifetimes of InAs/InAs1-xSbx type-II superlattices are presented. The longest lifetime at 11 K is 504 ± 40 ns and at 77 K is 412 ± 25 ns. Samples with long periods and small wave function overlaps have both non-radiative and radiative recombination mechanisms apparent, with comparable contributions from both near 77 K, and radiative recombination dominating at low temperatures. Samples with short periods and large wave function overlaps have radiative recombination dominating from 10 K until ~200 K. The improved lifetimes observed will enable long minority carrier lifetime superlattices to be designed for high quantum efficiency, low dark current infrared detectors.

Band gap formation in graphene by in-situ doping

We report the formation of band gaps in as-grown stacks of epitaxial graphene with opposite doping. Control of in-situ doping during carbon source molecular beam epitaxy growth on SiC was achieved by using different carbon sources. Doping heterostructures were grown by stacking n-type material from a C60 source on p-type material from a graphite filament source. Activation energies for the resistivity and carrier concentration indicated band gaps up to 200 meV. A photoconductivity threshold was observed in the range of the electrical activation energies. Band gap formation is attributed to electric fields induced by spatially separated ionized dopants of opposite charge.

Control of residual background carriers in undoped mid-infrared InAs/GaSb superlattices

The performance and operating temperature of infrared (IR) detectors is largely limited by thermal generation and noise processes in the active region of the device. Particularly, excess background charge carriers enhance Auger recombination and dark currents, and depress the detector figures of merit. Therefore, reducing background carriers in the undoped region of pin diodes is an important issue for developing high-operating temperature IR detectors. In this paper, we discuss how, through low-temperature Hall measurements, we optimized several growth and design parameters to lower residual carrier densities in various mid-IR InAs/GaSb superlattice (SL) designs. Among the growth/processing parameters investigated in the 21 Å InAs/24 Å GaSb SLs, neither growth temperature nor in-situ post-growth annealing significantly affected the overall carrier type and density. All of the mid-IR SL samples investigated were residually p-type. The lowest carrier density (1.8x1011 cm-2) was achieved in SLs grown at 400 °C and the density was not reduced any further by a post-growth anneal. The growth parameter that most affected the carrier density was interface composition control. With a minor variation in interface shutter sequence, the carrier density dramatically increased from ~2x1011 to 5x1012 cm-2, and the corresponding mobility dropped from 6600 to 26 cm2/Vs, indicating a degradation of interface quality. However, the carrier density was further reduced to 1x1011 cm-2 by increasing the GaSb layer width. More importantly, a dramatic improvement on the photoluminescence intensity was achieved with wider GaSb SLs. The disadvantage is that as GaSb layer width increases from 24 to 48 Å, the photoluminescence peak position shifts from 4.1 to 3.4 μm, for a fixed InAs width of 21 Å, indicating a photodiode based on these wider designs would fall short of fully covering the 3 to 5 μm mid-IR spectral region.