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Dive into the research topics where Sang-hyup Kwak is active.

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Featured researches published by Sang-hyup Kwak.


international solid-state circuits conference | 2010

A 7 Gb/s/pin 1 Gbit GDDR5 SDRAM With 2.5 ns Bank to Bank Active Time and No Bank Group Restriction

Tae-Young Oh; Young-Soo Sohn; Seung-Jun Bae; Min-Sang Park; Ji-Hoon Lim; Yong-Ki Cho; Dae-Hyun Kim; Dong-Min Kim; Hye-Ran Kim; Hyun-Joong Kim; Jin-Hyun Kim; Jin-Kook Kim; Young-Sik Kim; Byeong-Cheol Kim; Sang-hyup Kwak; Jae-Hyung Lee; Jae-Young Lee; Chang-Ho Shin; Yun-Seok Yang; Beom-Sig Cho; Sam-Young Bang; Hyang-ja Yang; Young-Ryeol Choi; Gil-Shin Moon; Cheol-Goo Park; Seok-won Hwang; Jeong-Don Lim; Kwang-Il Park; Joo Sun Choi; Young-Hyun Jun

This paper describes a 1 Gbit GDDR5 SDRAM with enhanced bank access flexibility for efficient data transfer in 7 Gb/s per pin IO bandwidth. The enhanced flexibility is achieved by elimination of bank group restriction and reduction of bank to bank active time to 2.5 ns. The effectiveness of these key features is verified by system model simulation including memory and its controller. To realize the enhanced bank access flexibility, this DRAM employs the following techniques: skewed control logic, PVT variation compensated IO sense amplifier with auto calibration by replica impedance monitor, FIFO based BLSA enable signal generator, low latency VPP generator and active jitter canceller. This GDDR5 SDRAM was fabricated in 50 nm standard DRAM process in 61.6 die area and operates with 1.5 V power supply.


international solid-state circuits conference | 2011

A 40nm 2Gb 7Gb/s/pin GDDR5 SDRAM with a programmable DQ ordering crosstalk equalizer and adjustable clock-tracking BW

Seung-Jun Bae; Young-Soo Sohn; Tae-Young Oh; Si-Hong Kim; Yun-Seok Yang; Dae-Hyun Kim; Sang-hyup Kwak; Ho-Seok Seol; Chang-Ho Shin; Min-Sang Park; Gong-Heom Han; Byeong-Cheol Kim; Yong-Ki Cho; Hye-Ran Kim; Su-Yeon Doo; Young-Sik Kim; Dong-seok Kang; Young-Ryeol Choi; Sam-Young Bang; Sun-Young Park; Yong-Jae Shin; Gil-Shin Moon; Cheol-Goo Park; Woo-seop Kim; Hyang-ja Yang; Jeong-Don Lim; Kwang-Il Park; Joo Sun Choi; Young-Hyun Jun

Most DRAM interfaces such as GDDR5 and DDR3 use parallel single-ended signaling due to pin-count restriction and backward compatibility. Notwithstanding poor signal and power integrity issues, GDDR5 speed reached beyond 5Gb/s in recent years by utilizing data bus inversion, error-detection coding, data training and channel equalization [1–3]. However, channel crosstalk is becoming a major barrier to further speed improvement. A common solution for channel crosstalk reduction at the system level is to use a shielding line or wide spacing between signal lines, but increasing the number of layers in a chip package and PCB increase system cost. To remove the shielding lines and increase speed, this paper presents a channel crosstalk equalizer with programmable signal ordering capability for the DRAM transmitter. In addition, this paper addresses tri-mode clocking to reduce the system jitter for better timing margin: PLL off, LC-PLL and injection-locked oscillator.


symposium on vlsi circuits | 2010

A 40nm 7Gb/s/pin single-ended transceiver with jitter and ISI reduction techniques for high-speed DRAM interface

Seung-Jun Bae; Young-Soo Sohn; Tae-Young Oh; Sang-hyup Kwak; Dong-Min Kim; Dae-Hyun Kim; Young-Sik Kim; Yoo-seok Yang; Su-Yeon Doo; Jin-Il Lee; Sam-Young Bang; Sun-Young Park; Ki-Woong Yeom; Jae-Young Lee; Hwan-Wook Park; Woo-seop Kim; Hyang-ja Yang; Kwang-Il Park; Joo Sun Choi; Young-Hyun Jun

A 7Gb/s single ended transceiver with low jitter and ISI is implemented in 40nm DRAM process. DRAM optimized LC PLL achieves inductor Q of 3.86 and results in random jitter of 670fs rms. A clock tree regulator with closed loop replica path reduces low as well as high frequency noise. RX 2-tap hybrid DFE combining sampling and integration methods reduces power and area by 37% and 24%, compared to the integrating DFE. Moreover, on-chip de-emphasis circuit in TX multiplexer reduces ISI of both on and off chip.


Archive | 2011

ON-DIE TERMINATION CIRCUIT, DATA OUTPUT BUFFER AND SEMICONDUCTOR MEMORY DEVICE

Ho-Seok Seol; Young-Soo Sohn; Dong-Min Kim; Jin-Il Lee; Kwang-II Park; Seung-Jun Bae; Sang-hyup Kwak


Archive | 2010

Bidirectional equalizer with CMOS inductive bias circuit

Seung-Jun Bae; Young-Sik Kim; Sang-hyup Kwak


Archive | 2009

Phase locked loop circuit, method of operating phase locked loop circuit and semiconductor memory device including phase locked loop circuit

Seung-Jun Bae; Young-Sik Kim; Sang-hyup Kwak


Archive | 2010

Data mask system and data mask method

Sang-hyup Kwak; Kwang-Il Park; Seung-Jun Bae


Archive | 2009

Input/output (io) interface and method of transmitting io data

Seung-Jun Bae; Young-Hyun Jun; Joo-Sun Choi; Kwang-Il Park; Sang-hyup Kwak


Archive | 2010

Semiconductor memory device comprising variable delay unit

Sang-hyup Kwak; Seung-Jun Bae; Young-Sik Kim


Archive | 2009

Phase-Locked Loop and Bias Generator

Young-Sik Kim; Seung-Jun Bae; Sang-hyup Kwak

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