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Dive into the research topics where Se-Jun Kim is active.

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Featured researches published by Se-Jun Kim.


IEEE Journal of Solid-state Circuits | 2002

Low-voltage DRAM sensing scheme with offset-cancellation sense amplifier

Sang-Hoon Hong; Se-Jun Kim; Jae-Kyung Wee; Seongsoo Lee

A novel bitline sensing scheme is proposed for low-voltage DRAM to achieve low power dissipation and compatibility with low-voltage CMOS. One of the major obstacles in low-voltage DRAM is the degradation of data-retention time due to low signal level at the memory cell, which requires power-consuming refresh operations more frequently. This paper proposes an offset-cancellation sense-amplifier scheme (OCSA) that improves data-retention time significantly even at low supply voltage. It also improves die efficiency, because the proposed scheme reduces the number of sense amplifiers by supporting more cells in each sense amplifier. Measurements show that the data-retention time of the proposed scheme at 1.5-V supply voltage is 2.4 times of the conventional scheme at 2.0 V.


asian solid state circuits conference | 2006

A 1.5-V 3.2 Gb/s/pin Graphic DDR4 SDRAM With Dual-Clock System, Four-Phase Input Strobing, and Low-Jitter Fully Analog DLL

Joohwan Cho; Ki Won Lee; Byoung-jin Choi; Geun-il Lee; Kwang-Jin Na; Ho-Don Jung; Wooyoung Lee; Ki-Chon Park; Yongsuk Joo; Jae-Hoon Cha; Se-Jun Kim; Young-Jung Choi; Patrik B. Moran; Jin-Hong Ahn; Joong-Sik Ki

Three circuit techniques for a 1.5 V, 512 Mb graphic DDR4 (GDDR4) SDRAM using a 90-nm DRAM process have been developed. First, a dual-clock system increases clocking accuracy and expands internal timing margins for harmonious core operation regardless of external clock frequency. Second, a four-phase data input strobe scheme helps to increase the input data valid window. Third, a fully analog delay-locked loop which provides a stable I/O clock and has 31.67 ps peak-to-peak jitter characteristics is designed. On the basis of these circuit techniques, the data rate is 3.2 Gbps/pin, which corresponds to 12.8 Gbps in times32 GDDR4-based I/O. Also, a multidivided architecture consisting of four independent 128 Mb core arrays is designed to reduce power line and output noise.


Focus on Powder Coatings | 2000

Interconnect strategy in deep-submicron DRAM technology

Jae-Kyung Wee; Si-Hong Kim; Yong-Jae Park; Se-Jun Kim; Jinyong Chung

This paper discusses the interconnect-related issues and general approaches in deep submicron technology. First, issues on interconnect library generation including simulations and measurements are discussed. Second, issues related to library-generating tools, which include parasitics extracting tools for early design stage and post-design stage, are analyzed. Third, issues are focused on design automation including chip floorplanner, interconnect-buffer optimizer, interconnect routing optimizer and so on. Finally we discuss our approach in DRAM technology. These interconnect-related items are relevant to chip families such as memory and logic device owing to hierarchical design concept, performance, cost, design-turn around times and so on.


Archive | 2003

Semiconductor memory device with reduced data access time

Jin-Hong Ahn; Sang-Hoon Hong; Se-Jun Kim; Jae-Bum Ko


Archive | 2004

Semiconductor memory device with optimum refresh cycle according to temperature variation

Se-Jun Kim; Sang-Hoon Hong; Jae-Bum Ko


Archive | 2003

Duty cycle correction circuit and delay locked loop having the same

Sang-Hoon Hong; Se-Jun Kim; Jeonghoon Kook


Archive | 2001

Synchronous semiconductor device for adjusting phase offset in a delay locked loop

Se-Jun Kim; Jae-Kyung Wee; Yong-Jae Park


Archive | 2003

Analog delay locked loop having duty cycle correction circuit

Se-Jun Kim; Sang-Hoon Hong; Jae-Bum Ko


Archive | 2003

Analog delay locked loop with tracking analog-digital converter

Se-Jun Kim; Sang-Hoon Hong; Jae-Bum Ko


Archive | 2004

Semiconductor memory device with efficient multiplexing of I/O pad in multi-chip package

Sang-Hoon Hong; Jae-Bum Ko; Se-Jun Kim

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