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Featured researches published by Seung-jin Seo.


intersociety conference on thermal and thermomechanical phenomena in electronic systems | 2012

Methodology on thermal prediction of high-power memory modules considering air velocity, chip size and power consumption

Je-Hyoung Park; Jae-Sang Baik; Jinkyu Chang; Seung-jin Seo

High-speed and high-density RDIMMs (Registered Dual Inline Memory Modules) which are employed in server platforms consume significant amount of power, operating at close to 100 °C. Thus it is very important to predict operating temperature of high-power memory modules at the early stage of development procedure to determine which type of cooling solution to employ. In this paper, we propose an approach for thermal prediction of high-power memory modules in server platforms. Through comprehensive thermal simulations using commercial CFD tool, FloTHERM, matrices of thermal data were obtained for various memory thermal conditions. Using the database, we built characteristic curves via curve-fitting. Characteristic curves are such that we can predict operating temperature of memory modules for various chip size and power dissipation under various memory thermal conditions. Predicted thermal results are in good agreement with measurement data with deviation of less than 3 °C (~5%).


Archive | 2004

Memory module test system

Young-man Ahn; Byung-se So; Seung-jin Seo; Seung-Man Shin


Archive | 2005

Method and apparatus for interfacing between test system and embedded memory on test mode setting operation

Seung-Man Shin; Seung-jin Seo; You-Keun Han; Hui-chong Shin; Jong-Geon Lee; Kyung Hee Han


Archive | 2008

Memory modules and memory systems having the same

You-Keun Han; Seung-jin Seo; Kwan-Yong Jin; Jung-Hwan Choi; Jonghoon Kim; Seok-Il Kim; Joo-Sun Choi


Archive | 2010

Method of testing a memory module and hub of the memory module

Seung-Man Shin; Byung-se So; Seung-jin Seo; You-Keun Han


Archive | 2006

Methods and apparatus for interfacing between test system and memory

Seung-Man Shin; Seung-jin Seo; You-Keun Han; Hui-chong Shin; Jong-Geon Lee; Kyung-Hee Han


Archive | 2005

Memory module, memory unit, and hub with non-periodic clock and methods of using the same

You-Keun Han; Hui-chong Shin; Seung-jin Seo; Byung-se So; Young-man Ahn; Seung-Man Shin; Jung-Kuk Lee; Ho-Suk Lee


Archive | 2010

Memory module including memory buffer and memory system having the same

Soon-Deok Jang; Seok-Il Kim; Seung-jin Seo; You-Keun Han


Archive | 2006

Memory module testing apparatus and method of testing memory modules

Jung-Kuk Lee; Seung-jin Seo; You-Keun Han; Seung-Man Shin; Young-man Ahn


Archive | 2002

Integrated circuit devices having delay circuits for controlling setup/delay times of data signals that are provided to memory devices

Young-man Ahn; Jin-ho So; Byung-se So; Seung-jin Seo

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