Shinji Aono
Mitsubishi
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Publication
Featured researches published by Shinji Aono.
international symposium on power semiconductor devices and ic's | 1997
Shinji Aono; Tetsuo Takahashi; Katsumi Nakamura; Hideki Nakamura; Akio Uenishi; Masana Harada
A simple and effective method of evaluating the carrier lifetime of a power device chip is proposed. In this method, Test Element Groups (TEGs) of diodes fabricated in the periphery of an Insulated Gate Bipolar Transistor (IGBT) chip were used as carrier lifetime monitors of the IGBTs n/sup -/ layer. The measured forward voltage drops (V/sub f/) of the diode-TEGs were compared with simulated V/sub f/ and the lifetime was determined from the lifetime parameter of simulations. The estimated lifetime value was verified by the reverse recovery current characteristic.
Archive | 2005
Shinji Aono; Aya Yamamoto; Hideki Takahashi; Kenzo Yamamoto; Ikuko Yamamoto
Archive | 2008
Hideki Takahashi; Shinji Aono
Archive | 2004
Shinji Aono; Hideki Takahashi; Aya Yamamoto; 綾 山本; 眞司 青野; 英樹 高橋
Archive | 2004
Shinji Aono; Hideki Takahashi; 眞司 青野; 英樹 高橋
Archive | 1999
Shinji Aono; Masana Harada
Archive | 2005
Shinji Aono; Aya Yamamoto; Hideki Takahashi
Archive | 2005
Hideki Takahashi; Shinji Aono
Archive | 2005
Hideki Takahashi; Shinji Aono
Archive | 1997
Shinji Aono
