Thien T. Nguyen
Advanced Micro Devices
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Publication
Featured researches published by Thien T. Nguyen.
Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing II | 1995
Ronald A. Carpio; Burt W. Fowler; Thien T. Nguyen
Fourier-transform infrared spectroscopy and spectroscopic ellipsometry are used to determine the composition and thickness of the fluorocarbon polymer formed during etching of silicon dioxide films on silicon substrates using C2F6 in a high- density plasma. The fluorocarbon polymer is characterized as the key process parameters are systematically varied.
Archive | 1999
Mark I. Gardner; Thien T. Nguyen
Archive | 1999
Mark I. Gardner; Thien T. Nguyen; Charles E. May
Archive | 1998
Mark I. Gardner; Thien T. Nguyen
Archive | 1998
Thien T. Nguyen; Mark I. Gardner; Charles E. May
Archive | 1999
Thien T. Nguyen; Mark I. Gardner; Frederick N. Hause
Archive | 1998
Mark I. Gardner; Derrick J. Wristers; Thien T. Nguyen
Archive | 1999
Thien T. Nguyen; Mark I. Gardner
Archive | 1998
Thien T. Nguyen; Mark I. Gardner; Charles E. May
Archive | 1996
Thien T. Nguyen