Tom A. Watson
Cymer, Inc.
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Featured researches published by Tom A. Watson.
Proceedings of SPIE, the International Society for Optical Engineering | 1999
Dave Myers; Tom A. Watson; Palash P. Das; Gunasiri G. Padmabandu; Paolo Zambon; Thomas Hofmann; William N. Partlo; Christopher Hysham; Richard Dunning
Now that 1000 Hz KrF excimer laser based DUV lithography tools are firmly established in production, emphasis is shifting from development towards improving the productivity and profitability of the manufacturing process, thereby reducing the cost per wafer. In this arena, laser manufacturers are competing now not only on performance but also on cost and productivity enhancements that the laser can offer to the lithography process.
26th Annual International Symposium on Microlithography | 2001
Thomas P. Duffey; Gerry M. Blumenstock; Vladimir B. Fleurov; Xiaojiang Pan; Peter C. Newman; Holger K. Glatzel; Tom A. Watson; Jeffrey Erxmeyer; Ralf Kuschnereit; Bernhard Weigl
The next generation 193 nm (ArF) laser has been designed and developed for high-volume production lithography. The NanoLithTM 7000, offering 20 Watts average output power at 4 kHz repetition rates is designed to support the highest exposure tool scan speeds for maximum productivity and wafer throughput. Fundamental design changes made to the laser core technologies are described. These advancements in core technology support the delivery of highly line-narrowed light with <EQ 0.35 pm FWHM and <EQ 0.95 pm at 95% included energy integral, enabling high contrast imaging from exposure tools with lens NA exceeding 0.75. The system has been designed to support production lithography, meeting specifications for bandwidth, dose stability (+/- 0.3% in 20 ms window) and wavelength stability (+/- 0.05 pm average line center error in 20 ms window) across 2 - 4 kHz repetition rates. Improvements in optical materials and coatings have led to increased lifetime of optics modules. Optimization of the discharge electrode design has increased chamber lifetime. Early life-testing indicates that the NanoLithTM core technologies have the potential for 400% reduction of cost of consumables as compared to its predecessor, the ELX-5000A and has been discussed elsewhere.
23rd Annual International Symposium on Microlithography | 1998
Thomas P. Duffey; Todd J. Embree; Toshihiko Ishihara; Richard G. Morton; William N. Partlo; Tom A. Watson; Richard L. Sandstrom
The present day notion of the extensibility of KrF laser technology to ArF is revisited. We show that a robust solution to ArF requirements can be met by significantly altering the lasers core technology-discharge chamber, pulsed power and optics. With these changes, a practical ArF tool can be developed. Some of the laser specifications are: Bandwidth: 0.6 pm (FWHM) 1.75 pm (95% Included Energy); Average Power: 5 W; Repetition Rate: 1000 Hz; Energy Stability (3(sigma) ): 20% (burst mode) 8% (continuous); Pulse Width: 25 ns.
conference on lasers and electro optics | 1998
Tom A. Watson
Summary form only given. The use of KrF and ArF excimer lasers as exposure sources for deep ultraviolet (DUV) lithography is discussed. Driven by extreme demands on performance, these lasers continually push the state-of-the-art in excimer laser design. Past, present, and future performance characteristics for these lasers are presented.
Proceedings of SPIE, the International Society for Optical Engineering | 1997
Tom A. Watson; Richard C. Ujazdowski; Palash P. Das
As applications have evolved out of the research areas, laser beam properties and component lifetimes have become critical to achieving low operating cost in a manufacturing environment. We will discuss the development of a 110 watt KrF laser using an all solid-state pulsed power system. Solid state pulsed power enables a significant reduction in system operating costs by greatly extending the exchange interval of the pulsed power and discharge chamber modules. Beam properties of the laser using both stable and unstable resonator configurations will be discussed.
Archive | 1999
David W. Myers; Herve A. Besaucele; Palash P. Das; Thomas P. Duffey; Alexander I. Ershov; Igor V. Fomenkov; Thomas Hofmann; Richard G. Morton; Richard M. Ness; Peter C. Newman; Robert G. Ozarski; Gamaralalage G. Padmabandu; William N. Partlo; Daniel A. Rothweil; Richard L. Sandstrom; Paul S. Thompson; Richard C. Ujazdowski; Tom A. Watson; R. Kyle Webb; Paolo Zambon
Archive | 1998
David S. Knowles; James H. Azzola; Herve A. Besaucele; Palash P. Das; Alexander I. Ershov; Igor V. Fomenkov; Tibor Juhasz; Robert G. Ozarski; William N. Partlo; Daniel A. Rothweil; Richard L. Sandstrom; Richard C. Ujazdowski; Tom A. Watson; Richard M. Ness
Archive | 1996
Daniel L. Birx; Palash P. Das; Igor V. Fomenkov; William N. Partlo; Tom A. Watson
Archive | 1998
Jason R. Carlesi; Shahryar Rokni; Mengxiong Gong; Tom A. Watson; Palash P. Das; Michael C. Binder; Muljadi Tantra; David J. Tammadge; Daniel G. Patterson
Archive | 1998
Mengxiong Gong; Tom A. Watson; Palash P. Das; Richard L. Sandstrom; Thomas P. Duffey