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Publication


Featured researches published by Tomohiro Hirai.


Archive | 2000

Defect sorting method and its device

Tomohiro Hirai; Toshishige Kurosaki; Akira Nakagaki; Kenji Obara; Yasuhiko Ozawa; Yuji Takagi; 亮 中垣; 健二 小原; 康彦 小沢; 大博 平井; 裕治 高木; 利榮 黒崎


Archive | 2011

Defect sorting method and defect sorting system

Yohei Minekawa; Yuji Takagi; Minoru Harada; Tomohiro Hirai; Akira Nakagaki; 亮 中垣; 実 原田; 陽平 嶺川; 大博 平井; 裕治 高木


Archive | 2004

Method and apparatus for classifying defects

Tomohiro Hirai; Toshifumi Honda; Atsushi Miyamoto; Hiroto Okuda; Yuji Takagi; 浩人 奥田; 敦 宮本; 大博 平井; 敏文 本田; 裕治 高木


Archive | 2011

Image classification method and image classification device

Minoru Harada; Tomohiro Hirai; Akira Nakagaki; 亮 中垣; 実 原田; 大博 平井


Archive | 2009

Defect observing method using sem, and apparatus therefor

Tomohiro Hirai; Takeshi Kamitaki; Atsushi Miyamoto; Akira Nakagaki; 剛 上瀧; 亮 中垣; 敦 宮本; 大博 平井


Archive | 2008

Defect inspection device, and parameter adjusting method used for defect inspection device

Tomohiro Hirai; Kenji Obara; Kohei Yamaguchi; 健二 小原; 宏平 山口; 大博 平井


Archive | 2005

SEMICONDUCTOR WAFER INSPECTION METHOD AND DEFECT REVIEW APPARATUS

Tomohiro Hirai; Kenji Obara; 健二 小原; 大博 平井


Archive | 2010

Defect inspection method and device using sem

Minoru Harada; Tomohiro Hirai; Toshifumi Honda; Naoki Hosoya; Akira Nakagaki; 亮 中垣; 実 原田; 大博 平井; 敏文 本田; 直樹 細谷


Archive | 2005

Automatic system for observing and classifying defect

Kazuo Aoki; Tomohiro Hirai; Kenji Obara; 健二 小原; 大博 平井; 一雄 青木


Archive | 2008

Reviewing process and device

Tomohiro Hirai; Kenji Obara; Tadama Saka; Kohei Yamaguchi; 直磨 坂; 健二 小原; 宏平 山口; 大博 平井

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