Yasuhiko Ozawa | Researchain

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Featured researches published by Yasuhiko Ozawa.

Archive | 1986

NMR imaging method

Koichi Sano; Tetsuo Yokoyama; Ryuzaburo Takeda; Yasuhiko Ozawa; Shinichi Sato; Hideaki Koizumi

Archive | 2003

Semiconductor inspection system

Atsushi Takane; Haruo Yoda; Shoji Yoshida; Mitsuji Ikeda; Yasuhiko Ozawa

Archive | 1999

Scanning electron microscope having magnification switching control

Ryo Nakagaki; Yuji Takagi; Atsushi Shimoda; Kenji Obara; Yasuhiko Ozawa; Hideka Bamba; Seiji Isogai; Kenji Watanabe; Chie Shishido; Toshiei Kurosaki

Archive | 2002

Charged particle beam alignment method and charged particle beam apparatus

Mitsugu Sato; Tadashi Otaka; Makoto Ezumi; Atsushi Takane; Shoji Yoshida; Satoru Yamaguchi; Yasuhiko Ozawa

Archive | 1999

METHOD AND DEVICE FOR SORTING DEFECTIVE IMAGE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE USING THEM

Shizushi Isogai; Toshishige Kurosaki; Akira Nakagaki; Kenji Obara; Yasuhiko Ozawa; Yuji Takagi; 亮中垣; 健二小原; 康彦小沢; 静志磯貝; 裕治高木; 利栄黒崎

Archive | 2006

Inspecting method, inspecting system, and method for manufacturing electronic devices

Yoko Ikeda; Junko Konishi; Hisafumi Iwata; Yuji Takagi; Kenji Obara; Ryo Nakagaki; Seiji Isogai; Yasuhiko Ozawa

Archive | 2000

Defect sorting method and its device

Tomohiro Hirai; Toshishige Kurosaki; Akira Nakagaki; Kenji Obara; Yasuhiko Ozawa; Yuji Takagi; 亮中垣; 健二小原; 康彦小沢; 大博平井; 裕治高木; 利榮黒崎

Archive | 1998

Observation of sample and device thereof

Hideharu Baba; Shizushi Isogai; Akira Nakagaki; Kenji Obara; Yasuhiko Ozawa; Atsushi Shimoda; Chie Shishido; Yuji Takagi; Kenji Watanabe; 篤下田; 亮中垣; 千絵宍戸; 健二小原; 康彦小沢; 健二渡辺; 静志磯貝; 英花馬場; 裕治高木

Archive | 2006