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Dive into the research topics where Toru Satake is active.

Publication


Featured researches published by Toru Satake.


Archive | 2004

Inspection apparatus by charged particle beam and method for manufacturing device using inspection apparatus

Masaki Hatakeyama; Toshifumi Kaneuma; Tsutomu Karimata; Takeshi Murakami; Shinji Nomichi; Toru Satake; Takuji Sofugawa; Kenichi Suematsu; Ryo Tajima; Yutaka Tanabe; Keiichi Toyama; Kenji Watanabe; Seiji Yoshikawa; 徹 佐竹; 省二 吉川; 拓司 曽布川; 健一 末松; 武司 村上; 賢治 渡辺; 努 狩俣; 涼 田島; 豊 田部; 雅規 畠山; 敬一 遠山; 伸治 野路; 利文 金馬


Archive | 2005

Inspection apparatus and method by electron beam, and device manufacturing method using the inspection apparatus

Masaki Hatakeyama; Tsutomu Karimata; Takeshi Murakami; Ichirota Nagahama; Takamitsu Nagai; Mamoru Nakasuji; Shinji Nomichi; Toru Satake; Takuji Sofugawa; Kazuyoshi Sugihara; Kenji Watanabe; Yuichiro Yamazaki; Seiji Yoshikawa; 護 中筋; 徹 佐竹; 省二 吉川; 裕一郎 山崎; 拓司 曽布川; 和佳 杉原; 武司 村上; 隆光 永井; 賢治 渡辺; 努 狩俣; 雅規 畠山; 伸治 野路; 一郎太 長濱


Archive | 2003

ELECTRON BEAM EQUIPMENT AND DEVICE MANUFACTURING METHOD USING THE SAME

Takao Kato; Takeshi Murakami; Mamoru Nakasuji; Toru Satake; Kenji Watanabe; 護 中筋; 徹 佐竹; 隆男 加藤; 武司 村上; 賢治 渡辺


Archive | 2004

Defect inspection method and device manufacturing method

Toshifumi Kaneuma; Mamoru Nakasuji; Toru Satake; 護 中筋; 徹 佐竹; 利文 金馬


Archive | 2001

Inspection device of pattern, inspection method of pattern, and manufacturing method of the inspection device

Masaki Hatakeyama; Toshifumi Kaneuma; Shinji Nomichi; Toru Satake; Kenji Watanabe; 徹 佐竹; 賢治 渡辺; 雅規 畠山; 伸治 野路; 利文 金馬


Archive | 2003

Mapping projectiion electron beam device

Masaki Hatakeyama; Toshifumi Kaneuma; Tsutomu Karimata; Takeshi Murakami; Shinji Nomichi; Toru Satake; Takuji Sofugawa; Kenji Watanabe; 徹 佐竹; 拓司 曽布川; 武司 村上; 賢治 渡辺; 努 狩俣; 雅規 畠山; 伸治 野路; 利文 金馬


Archive | 2004

Electron beam device and method for manufacturing device using it

Toru Kaga; Mamoru Nakasuji; Toru Satake; 護 中筋; 徹 佐竹; 徹 加賀


Archive | 2003

ELECTRON RAY APPARATUS AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE USING THE SAME

Takeshi Murakami; Mamoru Nakasuji; Shinji Nomichi; Toru Satake; 護 中筋; 徹 佐竹; 武司 村上; 伸治 野路


Archive | 2002

Charged particle beam device and device manufacturing method using the same

Muneki Hamashima; Mamoru Nakasuji; Hiroshi Nishimura; Shinji Nomichi; Toru Satake; 護 中筋; 徹 佐竹; 宗樹 浜島; 宏 西村; 伸治 野路


Archive | 2000

Electron beam device and semiconductor device manufacturing method using the same

Muneki Hamashima; Mamoru Nakasuji; Shinji Nomichi; Toru Satake; 護 中筋; 徹 佐竹; 宗樹 浜島; 伸治 野路

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